Template Manual Abb Ret 670 v1.1 Enu Tu2.22 v1.000

OMICRON PTL

RET 670 Transformer Differential Protection Test Template User Manual

OMICRON PTL Protection Test Template PTT Transformer Differential Protection ABB RET 670 V1.1 A32 User Manual

V1.000

© OMICRON electronics GmbH

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Contents

1 General Information ..................................................................................................................................3 2 Minimum Hardware Requirements..........................................................................................................4 3 Quick Start Information ............................................................................................................................4 4 Using the Template ...................................................................................................................................5 4.1 Test Object ...........................................................................................................................................5 4.2 Hardware Configuration .......................................................................................................................5 5 Required Test Modules and Test

Universe

Version..............................................................................9

6 Functional Range......................................................................................................................................9 7 Not Supported Functions.......................................................................................................................10 8 OMICRON Test Strategy.........................................................................................................................10 9 Template Structure .................................................................................................................................11 9.1 Wiring Test .........................................................................................................................................11 9.2 Initial Test ...........................................................................................................................................12 9.3 87 Configuration Test Primary............................................................................................................12 9.4 87 Configuration Test Secondary.......................................................................................................12 9.5 87 Diff Pickup and Drop-off Test Primary...........................................................................................13 9.6 87 Diff Pickup and Drop-off Test Secondary......................................................................................14 9.7 87 Diff Characteristic Test Primary.....................................................................................................14 9.8 87 Diff Harmonics Blocking Test ........................................................................................................15 9.9 50/51 (50N/51N) Overcurrent Pickup Tests.......................................................................................16 9.10 50/51 (50N/51N) Trip Times Test.....................................................................................................16 9.11 Thermal Overload Trip Time and Thermal Overload Warning Signal Test ......................................17 9.12 CB Test.............................................................................................................................................17 9.13 Reset of Trip Command Test ...........................................................................................................17 9.14 Tertiary Side Tests ...........................................................................................................................18 9.15 Using the RET 670 Transformer Differential Template for Two Winding Tests...............................18


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1 General Information The RET 670 transformer differential template is used for testing the current differential, overcurrent and thermal overload protection functions of the RET 670 relays. This template comprehends different modules for testing the main protection functions and the most important backup protection functions. The template is used for testing 3-winding or 2-winding transformer differential protection function. It is designed and configured for use with the ABB RET 670 V1.1 XRIO converter which is included in this template. For more information about the converter, see the ABB RET 670 XRIO Converter User Manual. Note: The template is designed and built for use with the Test Universe 2.22 SR2 software. The template is tested on the following relay: Manufacturer: ABB Serial no: T0802056 Firmware Version: V 1.1 Notes: •

The OMICRON PTTs are designed for an experienced OMICRON user. The user should be familiar with the Test Universe software and the XRIO technology (see http://www.omicron.at/products/training/ for training information).


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2 Minimum Hardware Requirements For working with this template, you need a CMC test set with six current outputs for the differential protection tests. To use the template with 5A relays, a CMC356 or a CMC 256 together with a CMA 156 current amplifier may be required. The development tests were performed with a CMC256plus.

3 Quick Start Information To test with the RET 670 transformer differential template: 1. 2.

Double click the file RET 670.occ to start the template-based procedure. Open the test object.

3.

Load (Import) the latest XRIO converter version for the RET 670.

4.

Enter your relay settings in the Relay Parameter Section, Additional Information – General Information – Hardware Configuration – Analog modules – Transformer Configuration Side1 (Side2 and Side3), and then click OK.

Figure 1: Relay settings in the XRIO converter 5. 6.

Open the Hardware Configuration. Enter all necessary information for: •

General

•

Analog Outputs

•

Binary / Analog Inputs

•

Binary Outputs

7.

DC Analog Inputs Click OK.

8. 9.

Follow the wiring instructions. Start testing.

•

10. Evaluate and archive the results.


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4 Using the Template The RET 670 transformer differential template is divided into three object groups: the test object, the hardware configuration and the list of OMICRON test modules used for testing the relay's protection functions. The OMICRON test mosules are classified in different main groups, which are set in a tree structure to create a better overview. The following test parts are available to t est the RET 670 protection functions: Pre-test structure with wiring and initial tests Primary-Secondary Side structure – This group contains all necessary sub-groups to test the transformer differential main- and back-up protection functions and the CB functionality at the two sides of a 2-winding transformer or the fault side primary to secondary for a 3-winding transformer. The CB Test in the Primary-Secondary Side structure is deactivated, if a 3-winding transformer is used. Primary-Tertiary Side structure: This group contains all necessary sub-groups to test the transformer differential main- and back-up protection functions and the CB functionality at the fault side primary to tertiary for a 3-winding transformer. This part is deactivated, if a 2-winding transformer is used. • •

•

The template can be used for testing the following protection functions: 87 Current differential protection 50, 50N, 51, 51N Definite time and instantaneous phase overcurrent 49 Thermal overload protection CB auxiliary contacts • • • •

4.1 Test Object The test object already contains the RET 670 XRIO converter which includes all setting parameters of the modeled RET 670 protection functions. The setting parameters are built as an image of the PCM 600 software. For more information, see the ABB RE T 670 XRIO Converter User Manual.

4.2 Hardware Configuration The global hardware configuration offers different configuration options for voltage and current outputs. For testing the RET 670 relay with the RET 670 differential test template, the standard configuration shown in the following figure is required.


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Figure 2: Configuration of the voltage and current outputs Note: If higher currents are needed for testing (e.g. relays with Inom = 5 A), the current output configuration can be adapted (e.g. set to 3°x°25°A). The following pictures show the connection of the CMC 256 to the relay. Figure 3 shows the connection diagram for primary to secondary tests and Figure 14 shows the connection for primary to tertiary tests.


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Figure 3: Connection diagram for primary to secondary tests


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In the Analog Outputs dialog box, the current outputs have to be routed to the name variables. Figure 4 shows the Analog Output configuration.

Figure 4: Analog Output configuration In the Binary / Analog Inputs dialog box, configure the signals as follows: 1 trigger signal set to Relay TRIP W1 1 trigger signal set to Relay TRIP W2 1 trigger signal set to Relay TRIP W3 1 trigger signal set to Start 1 trigger signal set to Thermal Overload Warning 1 signals for the circuit breaker auxiliary contacts set to CB aux. W1 (52a) 1 signals for the circuit breaker auxiliary contacts set to CB aux. W2 (52a) 1 signals for the circuit breaker auxiliary contacts set to CB aux. W3 (52a) • • • • • • • •

The following figure shows the Binary / Analog Inputs configuration. Note: The binary inputs are preset to potential free. Change these predefined settings to the values needed at the test site.

Figure 5: Binary / Analogue Inputs configuration


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The necessary signals, trip signal, starting signal and circuit breaker auxiliary contacts (CB aux.), have to be routed to the following binary inputs: Relay TRIP W1 to: binary input 1 Relay TRIP W2 to: binary input 2 Relay TRIP W3 to: binary input 3 Relay Start General to: binary input 5 Thermal Overload Warning to: binary input 6 CB aux. W1 to: binary input 7 CB aux. W2 to: binary input 8 CB aux. W3 to: binary input 9 • • • • • • • •

Note: The circuit breaker auxiliary contact is required for the trip t est with the circuit breaker. If the circuit breaker auxiliary contact cannot be connected to the binary inputs, the trip test with the circuit breaker cannot be performed.

5 Required Test Modules and Test Universe Version To use this template, you must have a valid test license for the OMICRON Test Universe 2.22 SR2 or higher and the following test modules: • • • • •

Control Center Ramping State Sequencer Advanced Differential (Diff Configuration, Diff Operating and Diff Trip Time Charactreistic) Overcurrent

6 Functional Range The test modules are grouped according to the protection function to be tested. The template includes test modules for the following protection f unctions: • • • • • • • • • • • • • • • • • • • • • •

Diff Configuration primary (87) Diff Configuration secondary (87) Diff pickup and drop-off primary (87) Diff pickup and drop-off secondary (87) Diff Operating Characteristic primary to secondary (87) Diff Trip Time Characteristic primary to secondary (87) th 5 Harmonic blocking Overcurrent primary (50, 50N, 51, ,51N) Overcurrent secondary (50, 50N, 51, 51N) Thermal overload warning primary (49) Thermal overload trip primary (49) Thermal overload warning secondary (49) Thermal overload trip secondary (49) Diff Configuration tertiary (87) Diff pickup and drop-off tertiary (87) Diff Operating Characteristic primary to tertiary (87) Diff Trip Time Characteristic primary to tertiary (87) Overcurrent tertiary (50, 50N, 51, 51N) Thermal overload warning tertiary (49) Thermal overload trip tertiary (49) Trip time with circuit breaker contacts Reset of trip command

The test modules are activated and deactivated automatically according to the corresponding protection function status in the test object.


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7 Not Supported Functions The following functions of the RET 670 relay are not supported by the transformer differential test template: Restricted Ground Fault Protection High impedance differential protection Distance protection Power Swing detection Automatic switch onto fault Breaker failure protection Pole discordance protection Overexcitation protection Multipurpose protection Synchrocheck and energizing check Over- / underfrequency (f<>) Over- / undervoltage (V<>) Monitoring Functions • • • • • • • • • • • • •

8 OMICRON Test Strategy The RET 670 differential test template includes the pick-up and trip time value tests which are performed in a standardized way. For the pick-up value testing, the setting value is evaluated by a ramp increasing the variable under test until the pick-up value is reached. The drop-off value is tested with a second ramp which decreases the variable under test until the starting signal drops off. Trip times are tested by simulating a fault which e xceeds the pick-up value and the specific tolerances. This results in a trip command of the tested protection function. The ti me between the simulation of the fault and the reception of the trip signal is measured and evaluated. Note: Do not only rely on the automatic assessment of the test points in the test modules but check the plausibility of all test results manually to achieve maximum reliabilit y of the test results.


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9 Template Structure The structure of the RET 670 differential test t emplate is shown below.

Figure 6: RET 670 differential test template Note If you want to use the RET 670 transformer differential template for testing the two-winding transformers with a relay similar to the RET 670 relay, connect the "Relay Trip W3" signal to the "Relay Trip W1" signal. This ensures that all trip s ignals routed in the test modules are available.

9.1 Wiring Test The wiring test is used to check the connections between the CMC test set and the relay. Therefore the OMICRON Diff Configuration test module is used to simulate a through fault condition with IFault = 1 × Iref. If the test set and the relay are connected correctly, the relay will not trip during this test. Check the output values with the values measured by the relay. If both values match, the relay and the test set are w ired correctly and the test can be manually assigned as passed.


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9.2 Initial Test The initial test is used to check w hether the relay trips when a standard fault condition occurs. The OMICRON Diff Trip Time Characteristic test module is used for the initi al test. A three-phase fault is simulated with Idiff = 2 × Iref which has to be switched off by the differential protection function of the relay.

9.3 87 Configuration Test Primary The configuration test is used to check the correct behaviour of the relay in a through fault condition, when the fault occurring on the primary side gets supplied from the secondary side of the protected object. Therefore the OMICRON Diff Configuration test module is used. The configuration test is executed for phase-phase faults and for phase-ground faults, in order to check the correct removal of the zero sequence components. The test is passed when no tr ip occurs and should be manually assigned.

Figure 7: Configuration test primary

9.4 87 Configuration Test Secondary The configuration test secondary is similar to the configuration test primary described above, but the fault location is on the secondary side of the protected object. The supply side is the primary side of the protected object.


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Figure 8: Configuration test secondary

9.5 87 Diff Pickup and Drop-off Test Primary This test is used to check the I diff> setting of the relay. Therefore a ramp module is used to inject a three phase current only on the primary side. This current is increased until the relay sends the pickup signal, which should occur when the current reach t he I diff>.

Figure 9: Pickup and Drop-off test primary


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9.6 87 Diff Pickup and Drop-off Test Secondary This test is similar to the pickup test realized for the primary side. In this case, a ramp module is used to inject a three phase current only on the secondary side.

9.7 87 Diff Characteristic Test Primary The diff characteristic test primary is designed for testing the relay's behaviour to internal fault conditions. Therefore the OMICRON Diff Operating Characteristics and the Diff Trip Time Characteristic test modules are used. The operating characteristic is tested with several search lines from 0.5 × Iref to 4 × Iref. The predefined search lines can be modified by t he user.

Figure 10: Diff operating characteristic test Note: The predefined search lines are limited to 4 × Iref due to the high currents needed for this test point, as high currents may damage the relay's current inputs. Note The diff operating characteristic is based on Iref values of the relay. It is not based on I nom as shown in the test module.


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The diff trip time characteristic is tested with a single test shot at I diff = 2 × Iref.

Figure 11: Diff trip time characteristic test Note: The test point can be modified by the user. If the t est current is too low, remove it and set a new test point.

9.8 87 Diff Harmonics Blocking Test th

The blocking of the differential protection function by 5 harmonics is tested with OMICRON Diff Harmonic Restraint test module. A search line is placed at I diff = 1.5 × Iref. Additional search li nes can be added by the user.

Figure 12: Diff harmonics blocking test nd

Note: The 2 harmonic test for RET 670 is not supported.


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9.9 50/51 (50N/51N) Overcurrent Pickup Tests These test modules are used to test the pickup signal of the 50/51 (50N/51N) overcurrent protection function of each winding. These tests are repeated for each transformer winding and will not be described again, as the other two tests are copies of the first one with different pickup values according to the transformer sides. The OMICRON Ramping test module is used for the overcurrent pickup tests. The current in the respective phase is increased until the 50/51 (50N/51N) pickup value is reached and the relay starts. The drop-off value is measured until the start signal is reseted. The r eset ratio is calculated for each value. Note: The differential function has to be blocked before testing the overcurrent functionality. Note: The Overcurrent parameters InMult, INnMult and StVaIMult can be activated in Additional Information -> Relay Information -> Configurations -> Overcurrent

9.10 50/51 (50N/51N) Trip Times Test The 50/51 (50N/51N) overcurrent trip times are tested with OMICRON Overcurrent test module. The modules are defined to test all the involved phases. The test shots are set at 1.15°x°I>, 0.9°x°I>>, 1.1°x°I>>, 0.9°x°I>>> and 1.1°x°I>>>. The trip time for each test point is measured and evaluated. Each phase is tested separately. This test is repeated for each transformer winding as described here.

Figure 13: 50/51 trip times test Note: The Overcurrent parameters InMult, INnMult and StVaIMult can be activated in Additional Information -> Relay Information -> Configurations -> Overcurrent


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9.11 Thermal Overload Trip Time and Thermal Overload Warning Signal Test The thermal overload warning and trip times signal of the relay is tested with the OMICRON Overcurrent test modules by simulating a three-phase fault. Generally the thermal overload warning and trip times tests start with the simul ation of a cold start resetting the thermal overload memory, i.e. the fault begins without pre-fault state. The test shot for both tests is set to 1.15 × IN. The only difference between the thermal overload warning and trip times test is the monitored binary input. The trip times test is routed to the trip signal, while the warning input of the relay is triggerd in the test of the thermal overload warning. Note: The memory of the relay's thermal overload model has to be reset prior each thermal overload test. For testing the thermal overload functionality behind the IHighTau threshold the OMICRON State Sequencer test module is used by simulating a three-phase fault. For more i nformation see the relay manual. Note: The thermal overload warning can only be tested if the warning signal of the thermal overload function is routed to one of the relay's outputs. Note: The Thermal Overload parameters ENMULTTTRn and FORCED COOL TTRn can be activated in Additional Information -> Relay Information -> Configurations -> Thermal Overload. Also the side of TTRn can be set there.

9.12 CB Test For testing the trip time with c ircuit breaker contacts test, an OMICRON State Sequencer test module is used. This test is divided into three sequencer states: pre-fault, fault and post-fault. The fault is a threepole fault with Idiff = 2 × Inom. The time elapse between the trip command and the circuit breaker open is evaluated.

9.13 Reset of Trip Command Test The reset of the trip command is tested with an OMICRON State Sequencer test module. A sequence of three states is used, beginning with a pre-fault state with nominal voltage and current. A fault with 2 × I diff> is created, forcing the relay to trip. The t ime between the trip command and the reset of the trip command is evaluated.


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9.14 Tertiary Side Tests For testing the three-winding transformers, the connection between the CMC test set and the relay has to be adapted as shown below.

Figure 14: Wiring information for primary to tertiary tests After the wiring has been adapted, the primary to tertiary tests can be executed. The tertiar y tests are similar to the primary to secondary tests descrtibed above. For more information on the tests, see the corresponding primary to secondary test description.

9.15 Using the RET 670 Transformer Differential Template for Two Winding Tests If you want to use the RET 670 transformer differential template for testing two-winding transformers with a relay similar to the RET 670 relay, connect the "Relay Trip W3" signal to the "Relay Trip W1" signal. This ensures that all trip signals routed in the test modules are available.


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Template Manual Abb Ret 670 v1.1 Enu Tu2.22 v1.000

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