Datasheet
Custom WaveView Waveorm Wa veorm Viewer and Simulation Post-processing Tool
Overview
Introduction
Custom WaveView™ is a graphical waveorm viewer and simulation post-processing tool or analog and mixed-signal ICs. Custom WaveView eatures ast loading, display scrolling, and zooming o very large waveorm fles, multiple simulator ormat support, and a rich set o analog and mixed-signal analysis eatures.
Custom WaveView is a ull analog and mixed-signal display and analysis environment, reading simulation results rom either analog or digital simulators and allowing complete conversion between views. For instance, Custom WaveView can read-in the analog results o an HSPICE ® simulation, convert those waveorms to digital (single or multi-bit with user-selectable thresholds) and export those results or use in a digital simulation. Custom WaveView also provides a host o capabilities or displaying, measuring, manipulating and saving simulation results. In addition to multiple panels containing waveorms, Custom WaveView can also display more than one waveorm tab allowing the designer to mix-and-match time and requency domains in a single session.
Figure 1: Custon WaveView Main Window
Custom WaveView supports many
Features Waveorm Display
dierent time and requency domain
Cursors
waveorm types, such as:
Monitors
Analog
Measurement Tool
Digital
Toolboxes and Assistants
Smith chart
Eye Diagrams
Polar plot
DFT/FFT
2-D, 3-D sweep
Eye diagram
Histogram
ADC Design Toolbox Jitter Toolbox Waveorm Post-processing with the Mixed-Signal Equation Builder Extensible and Open
Measurements Cursors, Monitors and the
Customizable GUI
Measurement Tool
Industry Standard Design Platorm Integrations
Cursors
All Supported File Formats
Custom WaveView provides an unlimited
Benefts
High-perormance waveorm database I/O to quickly access large amounts o
y
simulation data
Extensive mixed-signal display
Synopsys Cadence Design Systems y
unctions and analysis capabilities to
CustomSim™, HSPICE, and VCS® Spectre/RF, UltraSim, and Incisive
Mentor Graphics y
ModelSim, Eldo, ADMS, ADiT, HyperLynx
extract measurements rom simulation results
number o cursors specifcally or interactive on-screen measurement o waveorms. Set to either the vertical or horizontal mode, these cursors can be moved around the waveorm and display “X-at-Y” inormation on-screen. Monitors Monitors can be added to the waveorm
Single waveorm tool or multiple
Waveorm Display
simulators
Custom WaveView’s advanced user
measurements. Monitors include
Built-in support or HSPICE
interace allows the user to browse
Derivative, Inverse Derivative, Delta
.MEASURE command and parametric
waveorm data hierarchies and then
Value, Cursor Average, Minimum/
plots or .ALTER simulations
drag-and-drop multiple selected
Maximum/Average, Peak-to-Peak and
Transient, AC, RF, mixed-signal
signals into a waveorm display window.
RMS values o a given waveorm.
display and analysis
Waveorms in the display window can
Optional Tcl API or programming
have one or more non-overlapping
Measurement Tool
complex user post-processing scripts
panels. Panels in a window can be
Custom WaveView’s powerul
Flexible waveorm groupin g—add
arranged as either a vertical stack or as
Measurement tool provides a wealth
multiple waveorm views, either rom
independent rows and columns. Rows
o domain-specifc measurements
dierent simulator runs on the same
and columns may be vertical, horizontal,
that simpliy design analysis. The
circuit netlist or rom dierent netlists
or tiled.
Measurement tool provides rapid-on
Waveorm display includes:
Single Waveorm Tool or Multiple Simulators
Hierarchy browser and signal list
Waveorm display via data drag-and-
Custom WaveView is completely integrated with Synopsys’ Galaxy
drop
Signal search with pattern-matching
Custom Designer ® implementation tool
and wildcard; drag-and-drop rom
and supports cross-probing with the
search results
Custom Designer SE schematic editor.
User-defnable Hot Keys
Custom WaveView will also read many
Recent Files List
common SPICE, FastSPICE, and Verilog
Stack or Row column signal display
simulator waveorm fles rom Synopsys,
Save and Restore session
Mentor, and Cadence.
panels to perorm more complex
waveorm display o over 35 types o measurements. Measurements are persistent across sessions and can be “replayed” against a new set o simulation results as needed (see Figure 2). As simulation results change, measurements are updated automatically, presenting the user with the latest inormation available. The Measurement tool supports many measurements including time domain, requency domain, statistical, level, S-domain, and RF.
Custom WaveView
2
Eye Diagrams Custom WaveView’s eye diagram capability allows users to easily create a olded eye diagram rom complex waveorms. The eye diagram is constructed by automatically extracting the clock cycle, or by reerence to an ideal clock, or to an external signal. Once constructed, the Automatic Eye Measurement tool can take eye opening or aperture measurements as well as create a jitter histogram. Figure 3 shows a typical eye diagram with cursors used to measure the eye width.
Waveorm Post-processing
Figure 2: Measurement Tool
A-to-D; D-to-A Conversion
Analog waveorms can be converted to single-bit or multi-bit logic waveorms using user-specifed threshold criteria (See fgure 4). Similarly, logic waveorms can be converted to analog waveorms (see fgure 5) based on user-specifed analog levels using either fxed-rate sampling or value transition sampling.
Data Reduction and Export Redundant data points can be automatically removed based on a userspecifed error tolerance. Data can then be exported and saved using several dierent ormats such as tabulated, SPICE PWL, WDF, VCD, and M-ile (MatLab).
Figure 3: Eye Diagram
DFT/FFT
Custom WaveView supports FFT and DFT operations on time-domain data using various windowing unctions (see fgure 6). FFT/DFT will also automatically measure the signal-to-noise ratio (SNR), total harmonic distortion (THD), signalto-noise and distortion ratio (SNDR), and eective number o bits (ENB). Measurements also include:
Snap-to-wave eature
Measure update on reload
Glitch detection
Measurement export (as “.Meas”)
On-screen measure drawing
HSPICE measure tool
Custom WaveView
Figure 4: A nalog-to-Digital Conversion
3
Toolboxes and Assistants Custom WaveView’s toolboxes are provided to simpliy specifc measurements or a variety o common activities in waveorm analysis. Assistants are provided to simpliy common tasks that improve accuracy and customer productivity. ADC Design Toolbox
Custom WaveView’s ADC toolbox (see fgure 7) provides the necessary inormation when working with analogto-digital converters (ADCs). This toolbox, with a simple drag-and-drop o a waveorm, can extract the common measurements required to proo ADC
Figure 5: Digital-to-Analog Conversion
designs including: DC Static Characteristics Histogram, INL/DNL, min./max. values, and their standard deviations AC Dynamic Characteristics Using either Coherent or Window Sampling, the ADC toolbox measures noise parameters SNR, THD, SNDR, SFDR and ENOB and the requencydomain power spectrum Jitter Toolbox
The built-in Jitter-vs.-Time toolbox (see fgure 8) can be used to analyze clock jitter between any logic and analog target signal with respect to a reerence signal. The reerence signal can be an
Figure 6: FFT
analog or logic signal rom simulation output, or an ideal signal defned using the width/period/delay parameters. The jitter can be measured against the rise and all edges o a reerence signal.
Waveorm Post-processing with the Equation Builder Post-processing calculations using:
Graphical Calculator
Graphing Language
Equation builder
Custom WaveView hosts a powerul, scriptable mixed-signal equation
Custom WaveView
Figure 7: ADC Toolbox
4
language that can be used to construct any number o custom views o existing waveorms using multi-fle, multi-trace mixed-signal data, or to extract stimuli rom existing netlist and modiy them or the successive simulation runs. The Equation Builder (see Figure 9) contains a large number o built-in mathematic, RF, logic, waveorm and measurement unctions that can be mixed-andmatched as needed to create custom measurements. These custom measurements can be saved as macros and replayed against any simulation results as needed. Additionally, the Equation Builder contains unctions that can shit waveorms in time, making it
Figure 8: Jitter Toolbox Plot
easy to compare results that occurred at dierent simulated times. Waveorms can also be smoothed to reduce extra time points and exported to other simulations as stimuli leading to aster analog simulations downstream.
Extensible and Open Custom WaveView is open and extensible and can be controlled in either GUI or Batch mode with scripting. The GUI is also extensible, allowing CAD teams to crat custom measurements and provide them across their organizations through the regular menu system.
Optional regression Scripting with the Analysis Command Environment The Analysis Command Environment (ACE) is a Tcl-based extension language that provides near-complete control o Custom WaveView (via the ACE option). The ACE scripting environment contains hundreds o unctions and can control the GUI, the waveorm panels, the menu system or the measurement capabilities o either tool. Oten used by CAD teams to extend the tools, the ACE scripting
Figure 9: Equation Builder
capability can also be used to perorm Regression Scripting, allowing designers
Custom WaveView
5
CustomExplorer Ultra
Confguration management
4
Corners setup
4
Simulation job control
4
Results analysis
4
AMS debugger
CustomExplorer
Custom WaveView
4
SPICE debugger
4
4
Waveorm compare
4
4
tcl Scripting
4
4
(option)
Waveorm display
4
4
4
Table 1: CustomExplorer Family Products and Features
to make changes to their design and
Supported File Formats
y
CSDF (ASCII)
then replay a wide variety o analyses
Custom WaveView provides support or
y
Novas FSDB (Binary)
in batch mode, reeing the designer to
over 45 dierent fle ormats, providing
y
Legend (Tr0 Derivative)
work on other aspects o the design.
the highest support o simulation fle
y
SmartSPICE (Raw Derivative)
Encapsulating these analyses also
ormats in the industry.
y
Five proprietary simulator ormats
means sharing best design practices across an organization to improve quality and simpliy the collection o
are also available—please contact Supported Simulator Formats
Synopsys y
data or design reviews.
CustomSim and CustomSim FT
Synopsys
(HSIM, XA and NanoSim – WDF, Customizable GUI
WDB, .Out and Vector)
The GUI is ully customizable, and bind
y
keys can be assigned or any menu y
action.
y
Industry-standard Design Platorm Integrations
Custom WaveView is also integrated y
into industry-standard design platorms during the design phase. A native integration o these tools into Synopsys’ Custom Designer system helps orm a
Saber (AI/PL – Binary and ASCII)
EMF
UltraSim (PSF, WSF—Binary and
PNG
BMP
PSPICE (DAT)
y
Incisive (VCD)
Mentor Graphics y
Eldo (COU 4.3, 4.7 an d Tr0)
cell-based and custom design. Other
y
ADMS (WDB and JWDB)
design platorm integrations include:
y
ADiT (Tr0 and Tb0)
y
Debugging Environment
y
Custom WaveView
HyperLynx (CSV)
Platorm Support
Solaris 32- and 64-bit
Red Hat Enterprise Linux version 4 and 5 (AS, ES, WS)
SUSE Linux 9.0 and 10.0 and 5 (AS, ES, WS) 9.0 and 10.0
Microsot Windows XP
Others
JEDAT: Asca Circuit Design and Mentor Graphic: Design Architect® IC
Supported Plot Output File Formats
and ASCII)
authoring in a single platorm or both
Separated Values (CSV)
PostScript
complete environment or analog block
Cadence Design Systems: Virtuoso ®
Text table data and Comma
ModelSim (WLF)
Composer and ADE
y
Spectre (PSF, WSF—Binary
y
Tektronix Agilent and Lecroy Scope
JPEG
y
y
y
ASCII)
to help maximize designer productivity
BIS Models Data
VCS (VCD and VPD)
Cadence Design Systems y
y
HSPICE and HSPICE RF (.Tr0, . Ac0, .Sw0… – Binary and ASCII)
unction or waveview control button
Data Formats
Mathworks (.mat ormat) Agilent ADS (.ds—Binary and TouchStone S-Parameters—ASCII)
6
Features Input File Formats
Cadence Spectre PSF Cadence Spectre WSF Cadence PSPICE DAT Cadence Incisive VCD Cadence Ultrasim WDF Mentor Eldo cou Mentor Eldo WDB Mentor ADiT tr0 Mentor ADiT tb0 Mentor Eldo JWDB Novas FSDB Other SPICE raw Other Text txt Other Text csv Synopsys WDF Synopsys HSPICE tr# Synopsys HSPICE sw# Synopsys HSPICE ac# Synopsys HSPICE nw# Synopsys HSPICE mt# Synopsys HSPICE RF .ac# Synopsys HSPICE RF .sw# Synopsys HSPICE RF .ev# Synopsys HSPICE RF .e# Synopsys HSPICE RF .hb# Synopsys HSPICE RF .hl# Synopsys HSPICE RF .ls# Synopsys HSPICE RF .ss# Synopsys HSPICE RF .pn# Synopsys HSPICE RF .hr# Synopsys HSPICE RF .x# Synopsys HSPICE RF .ev# Synopsys HSPICE RF .sn# Synopsys HSPICE RF .sc# Synopsys HSPICE RF .tr# Synopsys HSPICE RF Citi Synopsys HSPICE RF Touchstone Synopsys Starsim xp0 Synopsys NanoSim out Synopsys NanoSim WDF Synopsys NanoSim CSDF Synopsys HSIM WDF Synopsys HSIM out Synopsys HSIM hsim Synopsys VCS vcd Synopsys VCS vpd
Synopsys, Inc.
y
700 East Middlefeld Road
y
Mountain View, CA 94043
y
www.synopsys.com
©2011 Synopsys, Inc. All rights reserved. Synopsys is a trademark o Synopsys, Inc. in the United States and other countries. A list o Synopsys trademarks is available at http://www.synopsys.com/copyright.html. All other names mentioned herein are trademarks or registered trademarks o their respective owners. 02/11.RP.CS308.
