SUB100 Series Ultrasonic Flaw Detector
Operating Manual
Soundwel Technology Co.,td
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CO!T"!TS #ntroduction ................................................................................................................................ 3 Sa$ety tips ........................................................................................................................... 3 Features ............................................................................................................................... 3 Functions ............................................................................................................................. 5 Speci$ications ................................................................................................................... 6 Unit ......................................................................................................................................... 7 ..... ................................................................................................. 7 %eypad introduction ......................................................................................................
Menu structure ................................................................................................................. 9 Display ................................................................................................................................. 10 !otes $or charging ........................................................................................................ 11 Basic operation ...................................................................................................................... 12 &ower on and o$$ ............................................................................................................ 12 Connect pro'e ................................................................................................................. 12 Testing range ad(ust)ent ......................................................................................... 12 Material *elocity and pro'e delay ad(ust)ent .......................................... .... 13 &ro'e para)eters setting ......................................................................................... 13 +ain ad(ust)ent ............................................................................................................. 14 +ate operation ................................................................................................................ 14 Mode reading )ethod- ......................................................................................... ..... 15 &ulse ad(ust)ent ........................................................................................................... 15 "cho operation introduction .................................................................................... 15 ssistant $unction ......................................................................................................... 16 Cali'ration ................................................................................................................................. 17 Cali'ration $or nor)al pro'e ................................................................................... 17 %nown )aterial *elocity and pro'e delay ........................................................ 17 Un/nown )aterial *elocity and pro'e delay ........................................... ....... 18 Cali'ration $or ngle pro'e ...................................................................................... 19 Cali'ration $or )aterial *elocity, pro'e delay and $ront edge ............... 19 Cali'ration $or angle% ................................................................................................ 20 Cali'ration $or the dualcrystal pro'e ................................................................ 21 DC2+ ............................................................................................................................. ........ 22 DC D C ....................................................................................................................................... 22 Draw DC ........................................................................................................................... 22 DC D C ad(ust)ent ad(us t)ent.............................................................................................................. 24 DC D C $itting $ittin g ......................................................................................................................... 24 2+（"3cept )odel SUB100） ............................................................................... 24 2+ 2 + $itting $ itting ......................................................................................................................... 26
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#ntr ntro oduction SUB100 series are portable and digital Ultrasonic Flaw Detector, the detector can rapidly, non-destructively and accurately test, locate and evaluate multi-defects, such as welding bead, crack, slag and blowhole etc.. The detector can be used in the laboratory, also can be used at the project site. The detector is widely used in the manufacturing, steel metallurgy, metal processing industry, chemistry etc. that the fields need testing defect and control ling quality, it is also widely used in in-service inspection and life span evaluation for the fields of aircraft, railway traffic, boiler, pressure vessels etc.
Sa$ety tips ◇ The detector is the device for industry ultrasonic non-destructive testing, can not use to medical testing;
◇ To ensure safety operation, the operator must have special knowledge of non-destructive testing;
◇ The detector must be used under allowed environment condition, especially, the detector can not be used under the strong magnetic field and strong corrosion environment； ◇To avoid unnecessary loss and ensure safety, please operate the detector according to the manual.
◇ Contact us when the detector appear fault, please don’t disassemble and repair it by yourself. Declaration ：SOUNDWEL has no responsibilities for any consequences caused by misuse, please operate the detector in proper according to the manual.
Features eatures SUB100 series Ultrasonic Flaw Detector are all digital, and have features of high speed, high accuracy, high efficiency, high reliability, good over-all properties, and real-time operation. The detectors designed using advance technology, so they have outstanding site properties. Multi-channel inspection, you can choose save as, it is useful for inspection. Large capacity storage for waveform, the waveform can be loaded. High speed and long time video for inspection process. Multi- shortcuts key, menu operation, digital shuttle roller, convenient to operate, advanced technology.
◇ TFT color screen with 5.7 inches，the color and bright can be set according to environment. ◇ Disassemble battery, online charging, offline charging and charge while working, convenient to change battery. Long time working outside and no worries. Small volume, light weight and portable. 3
◇ Damping match meets working requirement with different sensitivity and resolution . ◇ Four working modes：normal probe，angle probe，dual-crystal probe，through probe. ◇ Amplify receive Real-time sample：high speed ADC，fully display the wave detail. Rectify：Full, positive, negative, reflective Gate：dual-gate , support time gate and sound path gate. Gain：Multi-grade adjustable, has basic gain, scan gain, compensation gain, Support gain locked and auto gain.
◇ Alarm type Beep alarm and led alarm.
◇ Alarm condition It can be chosen among wave in gate, wave out gate, wave in curve and wave out curve
◇ Data save The detector designs save shortcut key, very convenient to operate. The save as, load, play and delete can be carried out quickly.
◇ Inspection function Peak memory： Search the highest wave in real-time, recording the maximum value of the defect. Echo envelope：Peak trace depiction for defect echo, it provides detail info for judging defect. Crack height measurement ：Automatically measure and calculate crack height. B-SCAN：Real-time scan, cross-section display, B-SCAN can display the workpiece shape which make the result displayed directly. Aperture：Auto calculating flaw equivalent i.e. Ф value. DAC、AVG：normal/angle probe inspect forged piece and the detector can find the highest wave of the defect and automatically calculate equivalent Φ, the DAC and AVG can be done in section. Record：Record waveform in real-time, save and play. Defect location：Horizontal value L, depth H, sound path S. Defect quantitative：Flexible displays according to setting reference. Defect qualitative：Manual experience judgment by envelope waveform. Curved surface correction：Inspection for curved surface workpiece, revise the curvity conversion.
◇ Real-time clock record Date, time tracking record and save.
◇ Communication High speed USB provides transportation data.
◇ Screen protection While standby，the screen bright will decrease or shut off automatically, this make the detector save energy, and extend life span.
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Functions The functions of SUB100 series are shown in the Table 1. Table 1 Functions of SUB100 series MODEL
SUB100 Series
FUNCTION
SUB100
SUB110
SUB120
SUB130
SUB140
SCREEN
TFT
TFT
TFT
TFT
TFT
DAC
√
√
√
√
√
AVG
╳
√
√
√
√
STANDARD INSIDE
╳
√
√
√
√
GATE ALARM
√
√
√
√
√
CURVE ALARM
√
√
√
√
√
WAVE FREEZE
√
√
√
√
√
CHANNEL
10
10
100
100
100
WAVE
100
100
1000
1000
1000
VEDIO
╳
5min×10
5min×20
5min×20
5min×20
60min×1
60min×1
AUTO CALIBRATION
√
√
√
√
√
REJECT
√
√
√
√
√
PEAK MEMORY
√
√
√
√
√
ECHO ENVELOPE
╳
√
√
√
√
THICKNESS B-SCAN
╳
√
√
√
√
COLOR B-SCAN
╳
╳
╳
√
√
AUTO GAIN
√
√
√
√
√
ECHO CODE
╳
╳
√
√
√
APERTURE
╳
╳
√
√
√
WELDING GRAPH
╳
╳
╳
╳
√
CRACK HEIGHT
╳
╳
╳
╳
√
╳
╳
√
√
√
PC SOFTWARE
√
√
√
√
√
BATTERY
1
1
2
2
2
CALCULATION
MEASUREMENT CURVED SURFACE CORRECTION
√：HAVE THE FUNCTION ╳：HAVE NO THE FUNCTION
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Speci$ications The specifications of SUB100 series are shown in the Table 2. Table 2 Specifications of SUB100 series SUB100 TESTING RANGE
SUB110
0～6000mm
SUB130
SUB140
0～9999mm
1000～9999m/s
VELOCITY
0～25000mm 400～20000m/s
0dB～110dB
GAIN
-20µs～+3400µs
DISPLAY DELAY
0µs～99.99µs
PROBE DELAY 0.2～10MHz
FREQUENCY
0.2～15MHz
100Ω，150Ω，200Ω，500Ω
PROBE DAMPING PROBE RPEATING FREQUENCY
10～1000Hz
10～2000Hz
＞62dB（DEPTH: 200mm，FLAT-BOTTOM HOLE Ф2）
SENSITIVITY
＞40dB（5P14）
RESOLUTION LINEARITY
0.2～20MHz
≤10％
NOISE LEVEL
0～80%（DIGITAL REJECT）
REJECT
VERTICAL LINEARITY ERROR HORIZONTAL LINEARITY ERROR
≤3% ≤0.1% ≥32dB
DYNAMIC RANGE PULSE PULSE
SUB120
SQUARE WAVE ENERGY
PULSE WIDTH
FIXED
MULTI-GRADES ADJUSTABLE
50～300ns
AUTO MATCH/ 50～1000ns
ENVIROMENT TEMPERATURE ENVIROMENT HUMIDITY
-10℃～50℃ 20%~95％ RH
POWER VOLTAGE
DC:7.2V;
AC:220V
≥ 20 hours
WORKING HOURS
220×175×59（mm）
SIZE WEIGHT
1.3 kg including battery
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Unit The face of SUB100 series Ultrasonic Flaw Detector is shown in the Fig. 1.
Fig.1 ⑴ Keypad (2) Hand-belt (3)TFT screen (4) Power indicator (5)Alarm indicator (6) Digital shuttle roller (10) Charging port
(7)supporter
(8)USB port
(11) Receiving port
(9)Reset and off port
(12) Receiving/transmitting port (13) Protecting shell
%eypad intro intr oduction The detector keypad is as shown in the Fig.2.
Fig.2
function selecting keys 7
Down arrow, use to use to select sub menu downward. ENTER key, to confirm each operation. Up arrow, use to select sub menu upward. Power indicator Alarm indicator Base function keys, it includes RANGE, GATES, GAIN, MODE and ECHO, the detail info. refer to Table3.
Calibration function keys, it includes PROBE, CAL, ANGLE, PULSER and SETUP, the detail info. refer to Table3.
Save function keys, it includes CHNL, WAVE, VIDEO, RESET and RESV, the detail info. refer to Table3.
System function keys about the detector, it includes DISP, SCALE, ALARMS, SETUP and INFO, the detail info. refer to Table3.
Function keys about the special function of the detector, it includes SCAN, WELD, DIAM, CRACK and CSC, the detail info. refer to Table3.
Gate shortcuts key, the detail info about gate can be set directly by pressing GATE key. Gain shortcuts key, the detail info about gain can be set directly by pressing GAIN key.
Channel shortcuts key, the detail info about channel can be checked directly by pressing GAIN key. Angle shortcuts key, the detail info about angle can be set and calibrated directly by pressing ANGLE key
Curve function key, DAC and AVG can be switched by pressing CURVE key.
Expand shortcuts key, the wave in the gate will expand automatically by pressing EXPAND key.
Color shortcuts key, you can directly set the color of the screen according to your requirement by pressing COLOR key.
Parameter shortcuts key, you can enter into the parameter setting GUI to set each parameter, it includes almost all parameters.
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Standard shortcuts key, you can enter into the standard setting GUI to select the standard according to your requirement.
Auto gain shortcuts key, the wave in the gate will arrive the reserved height ( default value )
Peak memory shortcuts key, the peak memory and echo envelope will be opened or switched by pressing PEK MEM key.
Record shortcuts key, the detector will directly enter into the video operation GUI, or stop recording by pressing RECORD key.
The wave will be frozen by pressing FREEZE key.
Digital shuttle roller, mainly used to increase or decrease, step selection. The keypad area is divided into three parts as shown in the Fig.2. The first part is the first row, that is function selection key composed of F1,F2,F3,F4 and F5.You can select the function option in accordance with the main menu below the screen by pressing these five keys. Second part is the second row includes three basic operation buttons which are UP, ENTER, DOWN key, different parameters at the right screen in the sub menu can be switched by pressing UP and DOWN key, press ENTER key to confirm operation and enter into the next step. The third part is the area of function group and shortcuts.
Menu structure The menu structure of the SUB100 series is shown in the Table3.
BASE RANGE RANGEmm
CAL PROBE
MTLVELm/s
GATES
P-TYPE
SAVE CHAN
P-FREQ
SELECT
SYSTEM DISP
LIGHT
SAVE
CURVE DAC
COLOR
DRAW
AVG
FUNC DRAW
DB-BAS
DB-BAS
dB
dB
SCAN
B-SCAN B-DIR
D-DLY us
X-VAL
DELETE
ECHO-H
ECHO-H
PERIOD
P-DLY us
P-SIZE
SAVE
GSTART
GSTART
A-SCAN
AS
mm
mm
SELECT GSTART
CAL
AUTO MANUAL
WAVE
SELECT
SCALE
GRID
SAVE
UINITS mm
mm
9
EDIT
ADJUST INDEX
EDIT
ADJUST INDEX
WELD
PARAM
WIDTH mm
FRONT
LOAD
H-AXIX
THRESH
P-DLY
DELETE
ECHO-H
ECHO-H
GSTART
GSTART
mm GAIN
DB-BAS dB
ANGLE
AUTO
VIDEO SELECT
ALARMS KEY SND
OFFSET DAC-RL
OFFSET AVG-HL
DIAM
EOU DIAM
DB-STP dB
MANUAL
RECORD
BEEP ALM
DAC-SL
AVG-ML
GSTART
DB-SCN dB
ANGLE
PLAY
LED ALM
DAC-EL
AVG-LL
P-SIZE
DB-
ANGLE-K
DELETE
ALM TYPE
ALM
ALM
P-FREQ
REF
REF
CMP
dB MODE
LOGIC
PULSER ENERGY
AUTOSNAP
RESET ALL
P-WIDTH
SETUP
STANDARD
SETUP
FLAW
SETUP
AVG
CRACK HEIGHT
CHNL
TYP
REF
ALL
FLAW-D
REF-D
PT-A mm
FLAW-L
P-SIZE
PT-B
WAVE DETECT
PRF
ALL VDO
P-DAMP
mm
RECALL
SHUTDOWN
DAC
P-FREQ
GSTART
REF ECHO
RECTIFY
SETUP
THICK
RESV
INFO
YY-MM-DD
DISP
DAC
mm DISP
AVG
SHOW
SHOW
CSC
O-DIAM
REJECT
AUTO-80
HH:MM
TYPE
TYPE
I-DIAM
FILL
PEAK
FW VER
FITTING
FITTING
CSC
OTHER
DELETE
DELETE
MEM ECHO ENC
ENVELOPE
Table 3 Menu structure
Display SUB100 series detector mainly have echo GUI and setting GUI .Echo GUI consists mainly of echo display area, main menu, sub menu and basic info display area, shown in the Fig.3.
Fig. 3 10
Fig.4 Status bar
!otes $or charging ◇ Generally, charging time is about 6~10 hours . ◇ Be sure to use special charger to charge the battery. If charging the battery using other charger and resulting in breaking down, it will not belong to warranty scope.
◇ Lithium battery exists self-discharge. To protect the detector and battery, turn on the detector for one to two hours and charge at least per month, prevent the components in the detector from damp and battery within a deficit electricity which affect service life.
◇ Change new battery when working hour of battery shorten obviously and can not meet property requirement.
◇ Battery storage environment and charging places should avoid high temperature and moist, in addition, keep it clean, and ensure the detector without greasy dirt, corrosive liuid etc..
!specially, keep positive and negative pole of battery away from metal items.
◇Lithium consists of multi-elements, there is special protection circuit and device, it is strictly prohibited to disassemble or modify without authorization, it is strictly prohibited to suee"e battery, make battery short-circuit. #therwise, serious conseuen ces will be caused.
◇ Be careful to transport and use, prevent from battery excessive shock, even more avoid falling, bump, battery pierced, water immersion, rain, etc to happen.
◇ Please cut off power and contact SOUNDWEL, when abnormal phenomenon of overheat etc. happen in process of charging.
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Basic operation &ower ower on and o$$ o$$
ON:
Press “
”key to start detector.
OFF:
Press “
”key long time under booting status to turn the detector off.
Notes:
◇ If press “
”key long time is invalid under booting status, please press “
”key five times
continuously to turn the detector off.
◇ Turn off by software: To avoid the failure of turning off the detector, the detector designs turn off function by software. Operation: press “system”, select “setup”, then select “SHUTDOWN” using UP or DOWN arrow key, press ENTER key to turn the detector off.
◇ Auto off ：alarm indicator will flash on the screen when the battery voltage is too low, the detector will save the data and turn off after three minutes.
◇ Turn off by hardware：there is reset button on the top of the detector, press the reset button to turn off the detector.
◇ After turning off the detector, all setup will not loss, the detector will recover the setup.
Connect pro'e Need to plug appropriate probe and cable to the detector before inspection, the cable should be coaxial-cable with 75Ω. Two plug seats on the top of detector to plug the probe. The probe cable can be plugged to any seat when using single crystal probe, for example, normal or angle probe.
The transmitting probe
cable needs to plug to transmitting plug seat, and the receiving probe cable need to connect to receiving plug seat, when using dual-crystal probe( one is transmitting crystal, the other is receiving crystal) or through probe (one is transmitting crystal, the other is receiving crystal)
Notes: The quality of the probe cable has effect on the testing result of the specification. If the transmitting probe cable and receiving probe cable misconnect when using dual-crystal probe, it may cause echo loss or waveform disorder.
Testing range ad(ust)ent a.
Press BASE key to enter into the base function group main menu, shown in the Fig.5. select “RANGE” by pressing F1. 12
Fig. 5 b. Select sub menu “RANGE” using [↓] or [↑], then roll the roller right or left to adjust range.
Material *elocity and pro'e delay ad(ust)ent a.
Press BASE key to enter into the base function group main menu, shown in the Fig.5, select “RANGE” by pressing F1.
b. Select sub menu “MTLVEL” using [↓] or [↑], shown in the Fig.6, then roll the roller right or left to adjust material velocity. c. Select “P-DLY” using [↓] or [↑], then roll the roller right or left to adjust probe delay.
Fig.6 NOTES：Once finishing calibrating P-DLY, can’t change, otherwise, the inspection accuracy will be affected.
&ro'e para)eters setting Probe parameters includes P-TYPE, P-FREQ,X-VAL,P-SIZE. Operations： a.
Press CAL key to enter into the calibrating function menu, select “PROBE” using F1， the “PROBE”is selected，shown in the Fig.7.
Fig.7 b.
Select “P-TYPE” using [ ↓] or [↑]，then select NORMAL, ANGLE, DUAL and THRU by rolling the roller right or left. If this parameter changes, the detector should be re-calibrated. The symbol
appears on the screen, when you select NORMAL; the symbol
when you select ANGLE; the symbol
appears,
appears, when you select DUAL; the symbol
appears, when you select THTU.
c.
The setting methods of the P-FREQ, X-VAL and P-SIZE are the same as P-TYPE. NOTE：Input P-FREQ and P-SIZE according to the nominal value of the probe before testing.
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+ain ad(ust)ent The unit series includes auto gain and manual gain adjustment. Auto gain operations： a. Change the gain value of the auto gain first. Operation：Press CAL key, select “SETUP” by pressing F5, select “AUTO-80”in the main menu “SETUP” using [↓] or [↑], adjust the value to required gain, then press AUTO GAIN key, the detector will amplify the echo according to the required gain. b. Lock the echo using gate, then press AUTO GAIN key when carrying out calibration or inspection operation, the echo in the gate will automatically arrive the pre-set echo height. Manual gain operations： a.
You can enter into the menu “GAIN” by pressing shortcuts key GAIN, and also can press BASE key to enter into the menu of base function group, select “GAIN” using function group key.
b.
Select “DB-BAS” using
[↓] or [↑] , then adjust the gain by rolling the roller right or
left. c.
If you need to adjust step, select “DB-STP” using [↓] or [↑], then adjust the step by rolling the roller right or left.
+ate operation The gate includes SELECT (gate selection), GSTART (gate start), WIDTH (gate width) and THRESH (gate threshold) Operations are as followings： To enter into the gate menu, you can press shortcuts key GATE, also you can press BASE key, and then select “GATES” by pressing F2. a.
Gate selecting operations
The detector has gate A and gate B. The user can select any gate as current using gate, it is just for current using gate that GSTART, WIDTH and THRESH will be introduced. The default current gate is gate A, press ENTER key or roll the roller to switch A and B, when the user want to select gate B as current gate. The current gate is displayed solid line, and non-current gate is displayed dotted line. b. Gate start Gate start adjustment means that you can adjust start location of the current gate, the user can lock the measuring echo by moving the gate. Select “GSTART ” using [↓] or [↑], and then roll the roller right or left to adjust gate start. c.
Gate width and threshold
Select “WIDTH” using [↓] or [↑], then roll the roller right or left to adjust gate width. Gate threshold refers to percentage relative to full screen of the echo display area. The gate threshold range can be adjusted is from 0% to 80%.
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Mode reading )ethodThe MODE menu includes LOGIC, AUTOSNAP and DETECT. Operations： a.
Press BASE to enter into the menu of base function group. Select “MODE” by pressing F4.
b. Select “LOGIC” using [↓] or [↑], then roll the roller right or left to select “1GATE” or “2 GATES”. c. I f you need AUTOSNAP function, select “AUTOSNAP” using [ ↓], then roll the roller right or left to open the AUTOSNAP function. d. The setting methods of the detection are the same as MODE or AUTOSNAP.
&ulse ad(ust)ent The emitting pulse includes ENERGY（the energy of SUB100、SUB110 is fixed value， the energy of SUB120、SUB130、SUB140 is adjustable）, P-WIDTH, PRF, P-DAMP Operations： a.
Press CAL key to enter into the menu of calibrating function group, then select “PULSER” by pressing F4 to enter into the sub menu.
b. Select “ENERGY” using [ ↓] or [↑], then roll the roller right or left or ENTER key to adjust the energy. c. The operations methods of “P-WIDTH” are the same as ENERGY, in addition, after adjusting ENERGY, select “P-WIDTH” using [↓] or [↑], then roll the roller right or left or press ENTER key to adjust the P-WIDTH. d. The operation methods of PRF and P-DAMP are the same as ENERGY and P-WIDTH.
"cho operation introduction Echo function includes RECTIFY, REJECT, FILL, and ECHO ENC（except SUB100、SUB110）. a. Press BASE key to enter into the main menu of base function group, and then select “ECHO” by pressing F5 to enter into the sub menu of ECHO. b. Select “RECTIFY” using [↓] or [↑], then roll the roller right or left or press ENTER key to select POS, NEG, FULL or RF. c. The operation methods of “REJECT” are the same as “RECTIFY”, in addition ，after adjusting rectify, select “REJECT” using [↓], then roll the roller right or left or press ENTER key to adjust the reject. d. Select “FILL” using [ ↓] or [↑], roll the roller right or left or press ENTER key to open or shut off the fill function. d. The operation methods of ECHO ENC are the same as FILL.
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ssistant $unction
Assistant function includes SCAN, WELD, CRACK, CSC, PEAK VIDEO, ALARM and SAVE etc. The detail location refers to Table3. Crack measurement (SUB140） It is use to measure crack height. P-DLY and K needs to calibrate before measuring. Operations： a.
Press FUNC key to enter into operation GUI, select “CRACK” by pressing F4,then select “HEIGHT” using [↓] or [↑].
b.
Move probe on the measured material ，shown in the Fig.8, and find the echo of the upper point of the crack ，press ENTER key，lock the defect echo according to the tips at the bottom of the screen, then press ENTER key, at the same time, “PT-A” display upper point height.
c.
Move the probe again to find the lower endpoint echo, lock the defect echo according to the tips at the bottom of the screen, then press ENTER key, at the same time, “PT-B” display lower endpoint height, and “HEIGHT” option display the crack height.
缺陷高度 Crack height
Fig.8
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Cali'ration The chapter mainly introduce the calibration of the digital ultrasonic flaw detector. The calibration of the detector refers to MTLVEL(material velocity), P-DLY(probe delay) calibration, X-VAL(probe front edge) and K measurement. The detector has two calibration methods: manual setup and auto calibration. Manual setup means directly input the known and accurate probe parameters to realize calibration. Auto calibration play an important role in programming control and signal processing of the Digital Ultrasonic Flaw Detector, probe delay can be calibrated automatically under the highest peak by the detector. Inspection preparation:
◇The surface temperature of the workpiece can not overheat, it should be less than 120℃. ◇Ensure the surface roughness of the workpiece is not oversize, otherwise, the inspection effects will be influenced. The metallic luster of the measured workpiece surface must be exposed and smooth.
◇To benefit inspection, couplant must be applied on the workpiece surface. Probe preparation：choose proper probe according to the workpiece shape and defect properties and plug it to the top interface of the instrument before powering on. The instrument and probe parameters must be calibrated before inspection.
Cali'ration $or nor)al pro'e The calibration items of the normal probe with single crystal are material longitudinal wave velocity and probe delay (the error caused by protecting coat, transmitting synchronous). The calibration includes the following conditions:
Known material velocity and probe delay；
Unknown material velocity and probe delay；
%nown )aterial *elocity and pro'e delay a. Select channel and clear it. b. Press CAL key to enter the calibrating operation GUI, set the probe type as normal probe in the main menu “PROBE”, then input probe frequency and crystal dimensions. c. Select the main menu “CAL”, then select the sub menu “MANUAL”, shown in the Fig.9，press the roller to start manual setup, input MTLVEL an P-DLY according to the prompt words.
Fig. 9
17
Un/nown )aterial *elocity and pro'e delay Required materials: the block with known thickness, and its material is identical to the measured material, couplant. Case1 Unknown material velocity, automatically calibrate normal probe Instrument：SUB100 Digital Ultrasonic Flaw Detector Probe： 2.5MHz φ 20 Block:
CS-1-5
a.
Select channel and clear it.
b.
Press CAL key to enter the calibrating operation GUI, select the main menu “PROBE”, set the probe type as normal probe, set the P -FREQ as 2.5MHz and crystal dimension as φ 20 .
c. select the main menu “CAL”, then select sub menu “AUTO”, and press ENTER key or the roller to start calibrating automatically according to the prompt words. d. Couple the probe on the block CS-1-5, set the MTLVEL as 5920m/s，P-DLY as default， PT1-PATH as 225mm,PT2-PATH as 450mm ，shown in the Fig.10.
Press ENTER key, at the
same time, the two gates respectively lock the two highest echoes, shown in the Fig.11. Press ENTER key to completing calibration.
Fig.10
Fig.11
18
Cali'ration $or ngle pro'e Manual setup operation for the angle probe is the same as the normal probe, it just need to input known parameters. The auto calibration will be mainly introduced following. Calibrating items for angle probe are as followings：Material transverse velocity (MTLVEL), front edge(X-VALUE),probe delay (P-DLY), ANGLE/K. Generally, calibrate MTLVEL, P-DLY and X-VALUE firstly, then ANGLE/K. On the whole, the block CSK-IA or IIW or others, ruler and couplant are required for angle probe calibration.
Cali'ration $or )aterial *elocity, pro'e delay and $ront edge Case2：Auto calibration for the angle probe that nominal value is 2.5P13×13，K2 using block CSK-IA. Instrument：SUB100 Digital Ultrasonic Flaw Detector Angle Probe： 2.5P13×13K2 Block ：CSK-IA a.
Select channel and clear it.
b. Press CAL key, select the main menu “PROBE”, set the “P-TYPE” as “ANLGE”, set the “P-FREQ” as “2.5MHz”, “P-SIZE” as “13”, default the X-VALUE ， c. Couple the probe on the block CSK-IA, select the main menu “CAL”, then select sub menu “AUTO”, press ENTER key, the screen will change, shown in the Fig.12.
Fig. 12 d. Set theoretical “MTLVEL”, “P-DLY” ， then set “PT1-PATH”=50mm，“PT2-PATH”=100mm. Press ENTER key after setting “PT2-PATH”. e. Open peak memory or echo envelope, shown in the Fig. 13, move the probe forward and 19
afterward along semidiameter R100 to make the echo highest，hold the probe still, shown in the Fig.14，press ENTER key to complete calibrating material velocity and probe delay. Meantime, the screen changes, shown in the Fig.15. Then, the detector starts to testing probe X-VALUE (front edge).
K2.0 2.5 3.0
0 . 0 3
R 5 0 .0 R 1 0 0 .0
0 . 0 0 1
CSK-1A
0 . 1 9
35.0 2.0
. 5 ? 1 K1.0
5 1
K1.5
0 . 6
200.0
Fig. 13
Fig.14
Fig.15 f. Measure the distance between the front edge of the probe and R100 using ruler, then input sub menu “FRONT”. In the case, the measuring result is 87mm, after input, press ENTER key to complete testing X-VALUE.
Cali'ration $or angle%
Case3：Auto calibration for the angle probe that nominal value is 2.5MHz K2 using block CSK-IAΦ50 Instrument：SUB100 Digital Ultrasonic Flaw Detector Angle probe： 2.5P13×13K2 Block ：CSK-IA (shown in the Fig.16)
Fig.16
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a. After completing material velocity and probe delay, select the main menu “ANGLE”, then select sub menu “AUTO”, press ENTER key to start calibrating angle automatically. Then the screen will change, shown in the Fig. 17. b. Set OBJ-D (object diameter) as 50mm, CN-DEPTH (center depth) as 30mm and nominal angle as 63.4˙/K2. c. Press PEAK MEMORY key, move the probe forward and afterward along the block, the echo envelope trace will be displayed on the screen, shown in the Fig.18.
Fig. 17 d.
Fig.18
Press ENTER key to completing angle/K calibration when the reflected wave arrive the highest according to the prompt words. Then, the angle/K was updated, shown in the Fig.19.
Fig.19
Cali'ration $or the dual dualcrystal pro'e Calibration for the dual-crystal probe is the same as normal probe,. Notes: Dual-crystal probe has focal point depth, so the user should select the block with the depth is closed to the focal point depth, when measuring material velocity and probe delay. Otherwise, the error of the measuring results may be large.
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DC2+ DC Draw DC DAC is the curve that describes the correlation of distance between reflecting point and wave source, echo height and equivalent size. Since the distance is different, the echo heights are different for the same size defects. Therefore, it is very important for defect’s quantitative analysis. DAC can be drawn automatically by the detector. Supposed testing conditions and requirements are as followings: Probe: 2.5P13×13, K2 Angle Block: CSK-ⅠA，CSK-ⅢA（shown in the Fig.20） DAC points: three (10, 20, 40) RL offset: 0dB SL offset: -10dB EL offset: -16dB 0 . 0 1
0 . 0 3
0 . 0 5
0 . 0 7
0 . 0 9 0 . 0 3 1
0 . 0 1 1 0 . 0 5 1
40.0
40.0
Fig.20 The manual conduct operation in brief. Step1: Choose parameter channel: press CHAN key to enter into the main menu “CHNL”, choose “SELECT” using [↓] or [↑], then roll the roller to select a channel, and select “DELETE” using [↓] or [↑] to clear the channel . Step2: Set probe parameters: Press CAL key, choose “P-TYPE” using [↓] or [↑], then select “ANGLE” using roller; select “P-FREQ” using [ ↓], set the probe frequency as 2.5MHz by rolling the roller, select “P-SIZE” using [↓], set it as 13mm using the roller. The other parameters can be set in the process or after completing testing. Step3: Test probe delay and material transverse velocity. Operation refers to automatically 22
calibrate probe delay. Step4: Test probe angle. Operation refers to automatically calibrate angle probe. Step5: Draw DAC To draw DAC, press CURVE, then the main menu for DAC will appear under the screen, select sub menu “DRAW” in the main menu “DAC”, press roller or ENTER ,start to draw DAC, the legend DAC appear on
the right top of the echo display area, at the same time, the detector
automatically select sub menu “GSTART”, then the number on the flag change to 1. Put the probe on the block CSK-ⅢA, the first testing hole with 10mm, move the probe left and right until finding the highest echo, roll the roller to move the gate to lock the echo， press ENTER
the detector
memory the peak height and location, meanwhile, complete this point testing, and the number under flag “DAC” on the screen change to 2, this shows the detector enter into the next testing point, shown in the Fig.21. Fig.21 Repeat the operation steps of the first testing point in proper order, and record the next point, such as 20mm, 40mm etc.. According to the above process, the detector automatically created a smooth DAC, while adding one point, the DAC will be automatically corrected and recreated. Drawing DAC requires at least two p oints or more, up to 32 points can be recorded by the detector. Generally, three to five points may meet the customer’s requirements according to the actual condition. During the drawing, you can exit DAC by pressing CURVE. To complete drawing DAC, select sub menu “DRAW”, press ENTER after finishing all testing points. The DAC was drawn above based on the basic line with
Φ1×6mm. After completing DAC , RL,
SL, and EL will be displayed on the screen according to the offset settings of RL, SL, and EL, three line in total. RL offset refers to the offset that can be selected between RL and BL; SL refers to the offset that can be selected between SL and BL; EL refers to offset that can be selected between EL and BL. The offset of RL, SL, and EL can be adjusted according to the inspection requirements and relative standards, the range is from -50dB to 50dB. In the case, RL offset was adjusted to 0 dB, SL offset was adjusted to -10 dB, EL offset was adjusted to -16 dB, as shown in the Fig.22
Fig. 22
To save the DAC, press SAVE, select main menu “WAVE”, select wave No. in the sub menu “SELECT”, then select sub menu “SAVE” using [ ↓], press ENTER to complete save. 23
Note: The probe zero offset, material velocity and probe angle must be calibrated correctly, otherwise, all DAC are not accurate.
DC ad(ust)ent If the deviation between the drawn DAC and actual echo is too large, adjusting function can be used to local adjustment. The operations are as followings: To adjust completed DAC, select sub menu “ADJUST” in the main menu “EDIT”, press ENTER. At the same time, the icon automatically select “INDEX” option which default value is 1, a flashing symbol “╳”appears on the first testing point echo, as shown in the Fig.23.
Fig.23 Select the testing point needed to adjust using roller, flashing symbol “╳ ”will move to the point you choose. And then select the sub menu “ECHO-H”, roll the roller, then the echo height change, press ENTER, the detector will indicate “DAC CURVE MODIFY SUCC”, next testing point can be adjusted using the same method. After adjusting, select sub menu “ADJUST”, then press ENTER to complete adjusting.
DC $itting To get smooth DAC curve, the detector designs curve fitting function. Operation: select DISP by pressing the corresponding function key in the main menu DAC function group. Set the “TYPE” as CV-LINE using [↓], [↑], ENTER or ROLLER, then select “FITTING” using [↓], and open it using ENTER or ROLLER.
2+（"3cept )odel SUB100） Supposed testing conditions and requirements are as followings: 1.
Probe:
2.5Φ20, Normal
2.
Block:
CS-1-5
3.
AVG method
The operation steps will be introduced in brief. Step1: Choose parameter channel: press CHAN key to enter into the main menu “CHNL”, choose “SELECT” using [↓] or [↑], then roll the roller to select a channel, and select “DELETE” using 24
[↓] or [↑] to clear the channel . Step2: Set probe parameters. Press CAL key, choose “P-TYPE” using [ ↓] or [↑], then select “NORMAL” using roller; select “P-FREQ” using [↓], set the probe frequency as 2.5MHz by rolling the roller, select “P-SIZE” using [↓], set it as 20mm using the roller. The other parameters can be set in the process or after completing testing. Step3: Test the probe delay and material longitudinal velocity. Operation refers to automatically calibrate probe delay. Step4: Draw AVG, the operations are as followings: To enter the DAC standard setting and drawing GUI, press CURVE key, and press it again to toggle to AVG standard setting and drawing GUI. Select the main menu “SETUP”, set the sub menu “AVG REF” to the type “bottom hole”, shown in Fig.24.
Fig.24 Select the main menu “AVG”, then select the sub menu “DRAW”, press ENTER key to start drawing AVG, the sub menu “DRAW” change “START” to “FINISHING” at once. The symbol “AVG” will appear on the right top of the wave display area, shown in the Fig.25. Move the probe on the block CS-1-5, adjust the gate location to lock the echo of the flat-bottom
Φ2, press ENTER key, the detector record the wave peak location and height in the gate, select the sub menu “DRAW” using [ ↑], press ENTER key to finish drawing AVG. hole
Fig.25
Fig.26
The screen displays three AVG curves after drawing AVG, shown in the Fig.26, which is generated based on the flat-bottom hole
Φ2 automatically. The three curves separately corresponding to the
high AVG curve, middle AVG curve, and lower AVG curve with three different bore diameter. To obtain the AVG curve with different diameter, and analysis conveniently for the defect, you
can reset the high AVG curve, middle AVG curve, and lower AVG curve, shown in the Fig.27.
Fig.27
The diameter Φ of the highest echo in the gate will be displayed on the status after drawing AVG. 25
The defect aperture
Φ will effect after drawing but no effect to DAC. When the gate lock the
defect echo, the detector automatically calculate the aperture value and location, and display on the status bar after drawing and displaying AVG. Note: When drawing AVG, please assure that whether the normal probe frequency and crystal diameter and other parameters setup are proper or not. Theoretically, the detector just only calculates the number after three times of near field region, and display straight line before three times of near field region. If the used block thickness is smaller, multi-echo will be required, which make the required echo outside the three times of near field region. After drawing AVG, the detector automatically transfer the curve to the high AVG curve, middle AVG curve, and lower AVG curve with three different bore diameter.
2+ $itting To get smooth AVG curve, the detector designs curve fitting function. Operation: select DISP by pressing the corresponding function key in the main menu AVG function group. Set the “TYPE” as CV-LINE using [↓], [↑], ENTER or ROLLER, then select “FITTING” using [↓], and open it using ENTER or ROLLER.
Tip:
To remind the operator, curve in the gate and out the gate alarm, can be used after drawing
DAC or AVG.
Beijing Soundwel Technology Co., Ltd. 8F, Tower F, Huating Jiayuan, No.6, N4th Ring Mid Road, Chaoyang District, Beijing100029, China. Phone: 86-10-82846705 Fax: 86-10-82846706 Email:
[email protected] www.soundwel.cn
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