E572-13 -Standard Test Method for Analysis of Stainless and Alloy Steels by Wavelength Dispersive X-Ray Fluorescence Spectrometry.

Designation: E572 − 13

Standard Test Method for

Analysis of Stainless and Alloy Steels by Wavelength Dispersive X-Ray Fluorescence Spectrometry 1 This standard is issued under the fixed designation E572; the number immediately following the designation indicates the year of original origin al adoption or, in the case of revis revision, ion, the year of last revision. revision. A number in paren parenthese thesess indicates the year of last reappr reapproval. oval. A superscript epsilon (´) indicates an editorial change since the last revision or reapproval.

1. Sco Scope pe

E1361 Gu Guid idee fo forr Cor Corre recti ction on of In Inter terel eleme ement nt Ef Effe fects cts in X-Ray Spectrometric Analysis E1621 Guide E1621 Guide for Elemental Analysis by Wavelength Dispersive X-Ray Fluor Fluorescenc escencee Spectr Spectrometry ometry

2

1.1 Thi Thiss test method method covers the analysis of stainless and alloy stee alloy steels ls by wav wavelen elength gth dis disper persiv sivee X-r X-ray ay Flu Fluore oresce scence nce Spectrometry Spectr ometry for the determination determination of the following elements: E l em e n t Chromium Cobalt Copper M a n g an es e M o l y b de n um Nickel Niobium Phosphorus S i l i c on S u l f ur Titanium Vanadium ` , , ` ` ` , , , , ` ` ` ` ` ` , , ` , , ` , ` , , ` -

3. Terminology

Range, Mass Fraction % 1 to 25 0 . 0 5 to 0 .4 5 0. 06 t o 3. 5 0 .3 to 5 .5 0 .0 5 to 3 .5 0 .7 to 3 5 0 .0 6 to 1 . 3 0 .0 1 to 0 .0 3 0 . 2 to 2 0 . 0 2 t o 0 .3 5 0 .0 1 3 to 0 . 5 0 . 0 4 to 0 . 2 5

3.1 For definitions definitions of terms used used in this test method, refer refer to Terminology E135 E135.. 4. Summ Summary ary of Test Test Method 4.1 The test specimen specimen is finished to a clean, uniform uniform surface and then irradiated with an X-ray beam of high energy. The secondary X-rays produced are dispersed by means of crystals and an d th thee co coun untt ra rates tes ar aree me meas asur ured ed by su suita itabl blee de dete tecto ctors rs at selected wavelengths. The outputs of the detectors in voltage pulses are counted. Radiation measurements are made based on the time required to reach a fixed number of counts, or on the total counts obtained for a fixed time (generally expressed in coun co unts ts pe perr un unit it tim time) e).. Ma Mass ss fr fract actio ions ns of th thee ele elemen ments ts ar aree determ det ermine ined d by rel relatin ating g the meas measure ured d rad radiati iation on of unk unknow nown n specimens to analytical curves prepared using suitable reference materials. Both simultaneous spectrometers containing a fixed-channel monochromator for each element and sequential spectrometers using a goniometer monochromator can be used for measurement of the elements.

NOTE 1—Mass fraction ranges can be extended upward by demonstration of accura accurate te calibr calibrations ations using suitable refer reference ence materials.

1.2 This standar standard d doe doess not purport purport to add addre ress ss all of the safet sa fetyy co conc ncer erns ns,, if an anyy, as asso socia ciated ted wi with th it itss us use. e. It is th thee responsibility of the user of this standard to establish appro priate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific precautionary statements are given in Section 10 10.. 2. Referenc Referenced ed Documents Documents 2.1 ASTM Standards: 3 E135 Term ermino inolog logy y Rela Relating ting to Ana Analyt lytical ical Che Chemist mistry ry for Metals, Ores, and Related Materials E177 Practice E177 Practice for Use of the Terms Precision and Bias in ASTM Test Methods E691 Practic Practicee for Conducting an Inter Interlabora laboratory tory Study to Determine the Precision of a Test Method

5. Signi Significanc ficancee and Use 5.1 This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assuree produ assur product ct qualit quality y. The analyti analytical cal perfo performance rmance data included may be used as a benchmark to determine if similar X-ray X-r ay spe spectro ctromete meters rs pro provide vide equi equivale valent nt prec precisio ision n and accuracy, or if the performance of a particular spectrometer has changed.

1 Thiss tes Thi testt met method hod is und under er the jur jurisd isdict iction ion of AS ASTM TM Com Committ mittee ee E01 on Analytical Chemistry Analytical Chemistry for Metals, Ores, and Relat Related ed Materials and is the direct responsibility of Subcommittee E01.01 Subcommittee E01.01 on on Iron, Steel, and Ferroalloys. Current edition approved Nov. 1, 2013. Published December 2013. Originally approved approv ed in 1976. Last previous edition approved in 2012 as E572 – 12. DOI: 10.1520/E0572-13. 2 Supporting data for this test method as determined by cooperative testing have been filed at ASTM International Headquarters as RR:E01-1118. 3 For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at [email protected]. For Annual Book of ASTM Standards volume information, refer to the standard’s Document Summary page on the ASTM website.

5.2 It is expected expected that thi thiss sta standa ndard rd will be emp employ loyed ed by analysts analys ts kno knowle wledge dgeable able in the fiel field d of X-r X-ray ay fluo fluores rescen cence ce spectr spe ctrome ometry try and experienc experienced ed in the use of the app appara aratus tus specified in this standard. 6. Interfere Interferences nces 6.1 Intere Interelement lement effects effects or matrix effects effects exist for some of the elements listed. Mathematical correction may be used to

Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States Copyright ASTM International Provided by IHS under license with ASTM No reproduction or networking permitted without license from IHS

1 Not for Resale

E572 − 13 solve for the solve these se elem element ents. s. Vari arious ous math mathema ematica ticall cor correct rection ion proced pro cedure uress are com common monly ly uti utilize lized. d. See Gui Guides des E1361 and E1621.. An E1621 Any y of th thes esee pr proc oced edur ures es th that at ac achi hiev eves es an analy alytic tical al accurac accu racy y equ equiva ivalent lent to tha thatt pro provid vided ed by thi thiss test method is acceptable.

8. Reag Reagents ents and Materials Materials 8.1 Detector Gas (P-10), consisting of a mixture of 90 % argon and 10 % methane, for use with gas-flow proportional counters only. 9. Referenc Referencee Materials Materials

7. Appar Apparatus atus

9.1 Certified Reference Materials are available from commercial and government sources.

7.1 Specimen Preparation Equipment: 7.1.1 Surfa Surface ce Gri Grinde nderr or San Sander der wit with h Abr Abrasi asive ve Belt Beltss or Disks, or Lathe, capable of providing a flat, uniform surface on the reference materials and test specimens. Aluminum oxide and zirconium oxide belts and discs with a grit size of between 60 and 180 have been found suitable.

9.2 Reference Materials with matrices similar to those of the test specimens and containing varying amounts of the elements to be de dete term rmin ined ed ma may y be us used ed pr prov ovid ided ed th they ey ha have ve be been en analyz ana lyzed ed in acco accorda rdance nce wit with h AST ASTM M stan standar dard d met method hodss or similar procedures established by the certifying body. These reference materials shall be homogeneous and free of voids and porosity.

7.2 Excitation Source: 7.2.1 X-ray Tube Power Supply, providing a constant potential or rectified power of sufficient energy to produce secondary radiation from the specimen for the elements specified. The generator may be equipped with a line voltage regulator and current stabilizer.

9.3 The reference reference mat materia erials ls sha shall ll cov cover er the mas masss fra fractio ction n ranges of the ele ranges elemen ments ts bei being ng sou sought ght.. A min minimu imum m of thr three ee reference materials shall be used for each element. A greater number of calibrants may be required if the analyst chooses to perform mathematical corrections for interelement effects. See E1361.. Guide E1361 Guide

7.2.2 X-ray Tubes, with targets of various high-purity elements men ts tha thatt are cap capabl ablee of con continu tinuous ous ope operat ration ion at req requir uired ed potentials and currents and that will excite the elements to be determined.

10. Haza Hazards rds 10.1 U.S Nuc 10.1 Nuclea learr Reg Regula ulator tory y Com Commis missio sion n Stan Standar dards ds for ionizing radiation as found in the Code of Federal Regulations 10 CFR Part 19, “Notices, Instructions and Reports to Workers: Inspection and Investigations” and 10 CFR Part 20, “Standards for Protec Protection tion Against Radiatio Radiation” n”4 sh shall all be ob obse serv rved ed at al alll X-ray emission spectrometer installations in the U.S. It is also recommended that operating and maintenance personnel follow the guidelines of safe operating procedures given in similar handbooks on radiation safety.

7.3 Spectrometer, designed for X-ray fluorescence analysis and equipped with specimen holders and a specimen chamber. The chamber shall contain a specimen spinner, and must be equipped for vacuum or helium-flushed operation for measurement of elements of atomic number 20 (calcium) and lower. 7.3.1 Analyzing Crystals, flat or curved crystals with optimized mize d cap capabi ability lity for the dif diffra fractio ction n of the wav wavelen elength gthss of interest. interes t. Synthetic multilayer multilayer structures can be used in place of crystals.

10.2 Expo Exposure sure to excess excessive ive quantities of high energy radiation such as those produced by X-ray spectrometers is injurious to health. The operator should take appropriate actions to avoid exposing any part of their body, not only to primary X rays, but also to secondary or scattered radiation that might be present. The X-ray spectrometer should be operated in accordance with regulat reg ulation ionss gov govern erning ing the use of ion ionizin izing g rad radiati iation. on. Dur During ing manufacturing, manufacturers of X-ray fluorescence spectrometers generally build into X-ray equip equipment ment appropriate appropriate shield shield-ing and safety interlocks that minimize the risk of excessive radiation exposure to operators. Operators should not attempt to byp bypass ass or def defeat eat the these se saf safety ety dev devices ices.. Onl Only y auth authori orized zed personnel perso nnel shoul should d servic servicee X-ray spectrometers. spectrometers.

7.3.2 Collimators or Slits, for controlling the divergence of the characteristic X rays. 7.3.3 Detectors, sealed sealed and gas gas-flo -flow w pro propor portio tional nal typ types, es, scintillation counters or equivalent. Some spectrometers may allow allo w for tandem use of two differ different ent det detecto ectors rs to incr increase ease sensitivity. 7.3.4 Vacuum providing g for the det determ ermina inatio tion n of Vacuum System, providin element elem entss who whose se rad radiati iation on is abs absorb orbed ed by air (fo (forr exa exampl mple, e, silicon, phosphorus, and sulfur). The system shall consist of a vacuum pump, gage, and electrical controls to provide automatic mat ic pu pump mp do down wn of th thee op optic tical al pa path th,, an and d to ma main intai tain n a cont co ntro rolle lled d pr pres essu sure re,, us usua ually lly 13 Pa (1 (100 00 µm Hg Hg)) or les less, s, controlled to 6 3 Pa (6 20 µm Hg) or better. A helium-flushed system is an alternative to a vacuum system, and it must be demons dem onstrat trated ed to pro provid videe suf suffficie icient nt stab stabilit ility y to ach achiev ievee the demonstrated demon strated repeatability repeatability perfo performance rmance of this standa standard. rd.

11. Preparation Preparation of Reference Materials and Test Test Specimens 11. 1.1 1 The an anal alys ystt mu must st ch choo oose se a me meas asur ureme ement nt ar area ea or diameter from the options built into the spectrometer. All test specimens and reference materials must have a flat surface of greater diameter than the chosen viewed area.

7.4 Measuring System, consisting of electronic circuits capable of amplifying and integrating pulses received from the detectors. For some measurements, a pulse height selector in conjunction with the detectors may be required to provide more accurate measurements. The system shall be equipped with an appropriate device. Copyright ASTM International Provided by IHS under license with ASTM No reproduction or networking permitted without license from IHS

4

Available from the Nuclear Regulatory Commission, Public Document Room, Mail Stop:OWFN-1 F13, Washington, DC 20555, (800) 397-4209, or via email at [email protected], or via the website at www.nrc.gov.

2 Not for Resale

` , , ` , ` , , ` , , ` ` ` ` ` ` , , , , ` ` ` , , ` -

E572 − 13 11.2 Prepar 11.2 Preparee the refere reference nce materials and test specim specimens ens to prov pr ovid idee a cle clean an,, fla flatt un unif ifor orm m su surf rfac acee to be ex expo pose sed d to th thee primary X-ray beam One surface of a reference material may be des design ignated ated by the pro produc ducer er as the cer certifie tified d sur surfac face. e. The same surface preparation medium shall be used for all reference materials and test specimens.

13. Calibration and and Standardization Standardization Calibrati ation on (Pr (Prepa eparat ration ion of Ana Analyti lytical cal Cur Curves ves)— )— 13.1 Calibr Using Usi ng the con conditi ditions ons esta establis blished hed in Sect Section ion 12 12,, measure measure a series ser ies of ref refere erence nce mat materia erials ls tha thatt cov cover er the req requir uired ed mas masss fraction ranges. Use at least three reference materials for each element. Prepare an analytical curve for each element being determined (refer to Guide E1621 Guide E1621)). For information on correction tio n of int intere ereleme lement nt ef effec fects ts in X-r X-ray ay fluo fluores rescen cence, ce, ref refer er to Guide E1361. E1361. Infor Informat mation ion on cor correc rection tion of spe spectr ctral al lin linee overlaps in wavelength dispersive X-ray spectrometry can be found in Guide E1621 E1621..

11. 1.3 3 As ne need eded ed,, re refin finis ish h th thee su surf rface acess of th thee re refe fere renc ncee materials and test specimens to eliminate oxidation. 12. Preparat Preparation ion of Apparatus Apparatus 12.1 Pre 12.1 Prepar paree and ope operat ratee the spe spectr ctrome ometer ter in acc accord ordanc ancee with the manuf manufacture acturer’s r’s instru instructions ctions..

13.2 Standardization (Analytical Curve Adjustment)— Using Using control reference materials, check the calibration of the X-ray spectrometer at a frequency consistent with the process control practice of the laboratory or when the detector gas or major spectrometer components have been changed. If the calibration check indicates that the spectrometer has drifted, make appropriate adjustments according to the instructions in the manufactur fac turer’ er’ss man manual ual.. Ref Refer er to Gui Guide de E1621 for fre freque quency ncy of verification of standardization.

NOTE 2—It is not within the scope of this test method to prescribe minute details relative to the preparation of the apparatus. For a description tio n and sp speci ecific fic det detail ailss co conce ncern rning ing the op opera eratio tion n of a par partic ticula ularr spectrometer, refer to the manufacturer’s manual.

12.1.1 Start-up— Turn Turn on the power supply and electronic circuits and allow sufficient time for instrument warm-up prior to taking measurements. Tube Pow Power er Sup Supply ply— — The 12.2 Tube The pow power er sup supply ply con conditi ditions ons should sho uld be set acco accordi rding ng to the man manufa ufactu cturer rerss reco recomme mmenda nda-tions. 12.2.1 12.2. 1 The voltage and current established established as optimu optimum m for the X-ray tube power supply in an individual laboratory shall be reproduced for subsequent measurements.

14. Procedur Proceduree 14.1 Specimen Loading— Place Place each reference material or test specimen in the appropriate specimen holding container. If thee sp th spect ectro romet meter er is eq equi uipp pped ed wi with th an au auto tomat mated ed lo load adin ing g device,, repeat device repeatability ability may be impro improved ved by loadin loading g and unloading all specimens from the same holder. The container shall have a suitable opening to achieve the required precision in an acceptable amount of time. The holder must be equipped to keep the specimen from moving inside the holder.

12.3 Proport When a gas gas-flo -flow w Proportional ional Coun Counter ter Gas Flow— When proportional counter is used, adjust the flow of the P-10 gas in accordance accord ance with the equip equipment ment manuf manufacture acturer’s r’s instru instructions ctions.. When changing P-10 tanks, the detectors should be adequately flushed with detector gas before the instrument is used. After changi cha nging ng P-1 P-10 0 tan tanks, ks, che check ck pul pulse se hei height ght sele selecto ctorr and gain settingss accord setting according ing to the manuf manufacture acturer’s r’s instru instructions ctions..

14.2 Excitation— Expose Expose the spe specim cimen en to pri primar mary y X-r X-ray ay radiation in accordance with Section 12 Section 12..

12.4 Measurement Conditions— The T he Kα (K-L2,3) lines are used for all elements in this standard. When using a sequential spectro spe ctromete meter, r, gon goniom iomete eterr ang angle le sett setting ingss sha shall ll be cal calibr ibrated ated according accord ing to the manuf manufacture acturer’s r’s guide guidelines. lines. 12.4.1 Crystals and Detectors— The The following crystals and detector choices are used for the elements indicated: El ement Chromium Cobalt Copper M an g an es e M o l y b d e n um Nickel Niobium Phosphorus Si l i c on S u l fu r Titanium Vanadium

Crystal L 1, L 2 L 1, L2 L1 , L 2 L1, L2 L1 , L2 L1 , L 2 L 1, L 2 Ge PET, InSb Ge L1, L2 L 1, L 2

Radiation Measur Measurements— ements— Obtai 14.3 Radiation O btain n and re recor cord d th thee counting rate for each element. Either fixed count or fixed time modes may be used.

14.4 Spectral Interfer Some X-ra X-ray y spec spectrom trometers eters Interferences— ences— Some willl not com wil comple pletely tely res resolv olvee rad radiati iation on fro from m sev several eral elem element ent combinations (for example, molybdenum and sulfur; molybdenum and phosphorus; and iron and cobalt). Therefore, care must be exercised in the interpretation of count rates when both elements are present. Mathematical calculations must be used to correct for the interferences.

Detector FP, SP, Sc FP, SP, Sc SP, FP, Sc FP, SP, Sc Sc , SP SP, FP, Sc Sc , SP FP, SP FP, SP FP, SP FP, SP FP, SP

14.5 Replicate Measurements— Make Make a single measurement on each test specimen. The performance of an X-ray spectrometer is not improved significantly by making multiple measurements on the same surface of the specimen. Confidence in the accuracy of analysis may improve by making multiple measurements on freshly prepared surfaces of the same specimen.

L1 = LiF LiF(20 (200), 0), L2 = LiF LiF(22 (220) 0) FP = Flow Proport Proportional, ional, SP = Sealed Propor Proportional tional,, Sc = Scinti Scintillatio llation n

15. Calc Calculat ulation ion of Results

Counting g Time— Collec 12.4.2 Countin C ollectt a suf sufffici icient ent num number ber of coun co unts ts so th that at th thee ra rand ndom om na natu ture re of XX-ra ray y em emiss issio ion n an and d counting does not significantly influence the repeatability of the measurements. measurements. A minimu minimum m of 10 000 counts is required required for a relative counting uncertainty of 1 % at a level of one standard deviation, and 40 000 counts is required for 0.5 % relative uncertainty. Copyright ASTM International Provided by IHS under license with ASTM No reproduction or networking permitted without license from IHS

15.1 Usi 15.1 Using ng the cou count nt rates for the test specimen specimen and the appropriate analytical curves, calculate the mass fractions of the various elements. 15.1.1 15.1. 1 If mathematical mathematical calculations calculations must be made to correct the mass fractions for interelement effects, any one of a number of co corr rrec ectio tion n pr proc oced edur ures es ma may y be em empl ploy oyed ed.. Ref Refer er to th thee 3 Not for Resale

` , , ` , ` , , ` , , ` ` ` ` ` ` , , , , ` ` ` , , ` -

E572 − 13 equipment manufacturer’s manual for the applicable procedure for the instrument being used. See Guide E1361 E1361..

16.2 Bias— At At the time of the interlaboratory study, a set of certified reference materials was provided for determining the bias of this test method. Bias estimates are represented by the difference, D, in Tables in Tables 13-24 below.

16. Pre Precisio cision n and Bias 16.1 The pr 16.1 prec ecis isio ion n of th this is te test st me meth thod od is ba base sed d on an interlaboratory study conducted in the 1980s. Each of seven laboratories tested 11 different steel alloy reference materials. Practice E691 Practice E691 was was followed for the design of the study and the analysis of the results. The details are given in RR:E01-1118. Repeatability ility Limit (r)— Two tes 16.1.1 Repeatab testt res results ults obt obtaine ained d within one laboratory shall be judged not equivalent if they differ by more than the “ r ” value for that material; “r ” is the interval representing the critical difference between two test results for the same material, obtained by the same operator usin us ing g th thee sa same me eq equi uipm pmen entt on th thee sa same me da day y in th thee sa same me laboratory. 16.1.1 16. 1.1.1 .1 Repeata Repeatabili bility ty Lim Limits its are list listed ed in Tables Tables 1-12 below. Reproducibility limit (R)— Two test results shall be 16.1.2 Reproducibility judged not equivalent if they dif differ fer by more than t han the t he “ R” value for that material; “ R” is the interval representing the critical differ dif ferenc encee betw between een two test res result ultss for the sam samee mat materia erial, l, obtained obtain ed by dif different ferent operators using dif differen ferentt equip equipment ment in different laboratories. 16.1.2 16. 1.2.1 .1 Rep Reprod roduci ucibil bility ity limi limits ts are giv given en in Tables Tables 1-12 below. 16.1.3 16.1. 3 The above terms (repe (repeatabilit atability y limit and reproducreproducibility limit) are used as specified in Practice E177 E177.. 16.1.4 16.1. 4 Any judgment judgment in accord accordance ance with statements 16.1.1 statements 16.1.1 and 16.1.2 would have an approximate 95 % probability of being correc correct. t.

16.3 The pre 16.3 precisi cision on and bias stat statemen ements ts wer weree det determ ermine ined d through throu gh statistical examination of result resultss from seven labor laboratoatories on these 11 materials: Samp Sa mple le 1:

Stan St anda dard rd Re Refe fere renc nce e Ma Mate teri rial al (S (SRM RM)) C1 C115 152, 2, U. U.S. S. National Institute of Standards and Technology SRM SR M 12 1219 19,, U. U.S. S. Na Nati tion onal al In Inst stit itut ute e of St Stan anda dard rds s and Technology SRM SR M 12 1267 67,, U. U.S. S. Na Nati tion onal al In Inst stit itut ute e of St Stan anda dard rds s and Technology SRM SR M C1 C128 287, 7, U. U.S. S. Na Nati tiona onall Ins Insti titut tute e of St Stand andar ards ds and Technology Cert Ce rtifi ified ed Re Refe fere renc nce e Ma Mate teri rial al (C (CRM RM)) SS SS46 467, 7, Jernknororets Sweden CRM S20 CRM CR M BS BS80 80E, E, Br Bram amme merr St Stan anda dard rd Co Comp mpan any y CRM CR M BS BS85 85C, C, Br Bram amme merr St Stan anda dard rd Co Comp mpan any y CRM CR M BS BS18 187, 7, Br Bram amme merr St Stan anda dard rd Co Comp mpan any y CRM CR M BS BS18 180, 0, Br Bram amme merr St Stan anda dard rd Co Comp mpan any y CRM S26

Samp Sa mple le 2: Samp Sa mple le 3: Samp Sa mple le 4: Samp Sa mple le 5: S a m p l e 6: Samp Sa mple le 7: Samp Sa mple le 8: Samp Sa mple le 9: Samp Sa mple le 10 10:: Sample 11:

16.4 To ju 16.4 judg dgee th thee eq equi uiva valen lency cy of tw two o te test st re resu sults lts,, it is recommended to choose the reference material most similar in characteristics to the test material. 17. Keyw Keywords ords 17.1 elemental elemental analys analysis; is; spectr spectrometric ometric analysis; stainle stainless ss steel; wavelen wavelength gth disper dispersive; sive; X-ray fluorescence fluorescence

TABLE 1 Nickel (%)

Material

Average ¯ X

Repeatability Standard Deviation s r

Reproducibility Standard Deviation s R

Repeatability Limit r

Reproducibility Limit R

3 2 11 7 5 8 1 10 6 4 9

0. 24 3 6 2.118 3 .2 9 9 8 .1 5 6 9 .2 3 7 1 0 .0 5 3 1 0 .9 3 8 1 3 .2 4 7 1 8 .5 8 4 2 1 .1 9 34.11

0. 00 3 8 0 .0 4 8 0 .0 1 5 0 .0 2 7 0 .0 3 3 0 .0 3 9 0 .0 3 1 0 .0 6 4 0 .0 6 8 0.11 0.11

0.11 0. 09 1 0 .0 6 1 0. 06 1 0. 07 9 0 . 06 7 0 . 07 5 0. 31 0 .5 8 0 .1 9 0 .1 7

0.011 0. 14 0. 0 43 0 .0 7 5 0 .0 9 4 0.11 0. 0 87 0 .1 8 0. 19 0 .2 9 0 .3 1

0 .3 1 0 .2 5 0 .1 7 0. 17 0. 22 0. 19 0 .2 1 0. 86 1 .6 0. 53 0. 47

--`,,```,,,,````-`-`,,`,,`,`,,`---

Copyright ASTM International Provided by IHS under license with ASTM No reproduction or networking permitted without license from IHS

4 Not for Resale

E572 − 13 TABLE 2 Chromium (%)

Material

Average ¯ X





6 2 7 8 1 5 11 9 10 3 4

2 .0 6 7 1 5. 75 1 7. 30 1 7. 72 1 7 .8 8 6 1 8. 19 1 9 .0 5 1 9. 98 2 1 .2 5 2 4. 12 2 4. 15

0 .0 1 0 0.116 0 .0 5 4 0 .0 4 6 0 .0 7 3 0 .0 6 0 0 .0 7 0 0 .0 7 3 0 .0 8 5 0 .0 7 2 0 .1 0

0 .0 8 6 0. 34 0. 19 0. 21 0 .2 1 0. 16 0 .2 4 0. 27 0 .1 8 0. 65 0. 42

0. 02 9 0 .3 2 0 .1 5 0 .1 3 0 .2 0 0 .1 7 0 .2 0 0 .2 0 0 .2 4 0 .2 0 0. 29

0 .2 4 0 .9 5 0 .5 3 0 .5 9 0. 60 0 .4 4 0. 68 0 .7 5 0. 51 1 .8 1 .2

TABLE 3 Manganese (%)

Material

Average ¯ X





3 2 9 5 11 1 6 8 4 7 10

0. 31 20 0. 42 42 0. 44 30 0. 76 37 0 .9 5 9 3 0. 96 58 1. 46 66 1. 63 13 1. 65 87 1 .7 3 5 4. 94 6

0. 00 2 3 0. 00 3 5 0. 00 3 9 0. 00 4 9 0 .0 0 5 0 0. 00 7 7 0. 00 5 3 0. 00 5 1 0. 00 7 9 0.011 0 .0 1 7

0. 04 7 0. 03 3 0. 03 5 0. 02 6 0 .0 3 4 0. 02 9 0. 08 4 0. 03 8 0. 04 9 0 .0 5 7 0 .1 6

0. 00 66 0. 00 97 0.011 0 .0 1 4 0. 01 4 0 .0 2 2 0 .0 1 5 0 .0 1 4 0 .0 2 2 0. 03 1 0. 04 6

0. 13 0 .0 9 3 0 .0 9 8 0 .0 7 4 0 .0 9 5 0 .0 8 0 0 .2 4 0.11 0 .1 4 0 .1 6 0 .4 4

TABLE 4 Copper (%)

Material

Average ¯ X





5 3 10 1 11 2 8 7 6 4 9

0. 02 96 0. 05 91 0 .0 8 0 9 0. 10 84 0 .1 3 5 3 0. 16 15 0. 31 04 0. 36 72 0. 44 19 0. 58 73 3. 29 14

0. 00 1 2 0. 00 1 2 0 .0 0 0 9 0. 00 1 2 0 .0 0 1 2 0. 00 1 3 0. 00 2 0 0. 00 2 0 0. 00 3 1 0. 00 3 2 0. 01 4 5

0. 01 8 0. 01 2 0 .0 1 6 0. 01 3 0.011 0 .0 0 8 9 0 .0 0 5 2 0 .0 0 9 0 0. 02 1 0. 01 4 0. 12

0. 00 33 0. 00 34 0 .0 0 2 6 0. 00 33 0 .0 0 3 4 0 .0 0 3 5 0 .0 0 5 5 0 .0 0 5 7 0. 00 88 0. 00 89 0. 04 0 7

0 .0 5 0 0 .0 3 3 0 .0 4 6 0 .0 3 6 0 .0 3 1 0 .0 2 5 0 .0 1 4 0 .0 2 5 0 .0 5 7 0 .0 4 0 0 .3 2 6

--`,,```,,,,````-`-`,,`,,`,`,,`---


5 Not for Resale

E572 − 13 TABLE 5 Molybdenum (%)

Material

Average ¯ X





5 3 2 8 1 4 7 9 10 11 6

0 .0 0 3 7 6 0 .0 1 3 5 0 0 .1 6 5 8 8 0 .3 3 2 8 1 0. 43 34 0. 46 13 0. 56 60 2 .0 6 4 2 .2 0 5 4 2 .6 3 7 6 3 .0 9 6

0 .0 0 0 2 8 0 .0 0 0 2 1 0 .0 0 0 9 6 0 .0 0 0 7 2 0.0011 0. 00 1 8 0. 00 2 9 0 .0 1 5 0 .0 0 7 0 0 .0 0 6 4 0 .0 5 2

0 .0 0 3 7 0 .0 0 7 1 0 .0 0 4 7 0 .0 0 3 2 0 .0 0 2 8 0 .0 0 4 9 0 .0 0 9 9 0 .0 6 0 0 .0 3 4 0 .0 6 9 0 .0 6 7

0 .0 0 0 8 0 0 .0 0 0 6 0 0. 00 27 0. 00 20 0 .0 0 3 1 0 .0 0 5 0 0 .0 0 8 1 0. 04 2 0. 02 0 0. 01 8 0 .1 4

0 .0 1 0 0 .0 2 0 0 .0 1 3 0 . 0 09 0 0 .0 0 7 7 0 .0 1 4 0 .0 2 8 0 .1 7 0 .0 9 6 0. 19 0. 19

TABLE 6 Silicon (%)

Material

Average ¯ X





9 10 8 5 2 7 3 11 1 4 6

0. 25 64 0 .3 2 1 0 0. 39 47 0. 50 30 0. 55 22 0. 57 77 0. 59 78 0 .6 7 2 6 0 .8 2 5 1 .6 7 9 1 .7 8 9

0. 00 7 4 0 .0 0 6 5 0. 00 6 8 0. 00 7 1 0. 00 7 7 0. 00 8 1 0. 00 8 9 0 .0 0 9 2 0.011 0 .0 1 6 0 .0 1 7

0. 02 6 0 .0 2 2 0. 02 0 0. 02 0 0. 02 3 0. 01 8 0. 02 5 0 .0 2 1 0 .0 2 3 0 .0 2 9 0 .0 6 0

0 .0 2 1 0. 01 8 0 .0 1 9 0 .0 2 0 0 .0 2 1 0 .0 2 3 0 .0 2 5 0. 02 6 0. 03 2 0. 04 5 0. 04 8

0 .0 7 4 0 .0 6 1 0 .0 5 7 0 .0 5 5 0 .0 6 3 0 .0 5 0 0 .0 7 1 0 .0 6 0 0 .0 6 5 0 .0 8 0 0 .1 7

TABLE 7 Niobium (%)

Material

Average ¯ X





3 2 8 7 11 4 1 10 9 5 6

0 .0 0 6 2 0 0 .0 1 4 6 9 0 .0 1 5 4 2 0 .0 1 6 4 8 0. 06 65 9 0 .0 7 1 9 1 0 .1 9 3 7 8 0. 21 34 1 0 .4 8 3 1 7 0. 94 31 1. 15 14

0 .0 0 0 1 4 0 .0 0 0 2 8 0 .0 0 0 3 6 0 .0 0 0 2 5 0. 00 0 38 0 .0 0 0 4 2 0 .0 0 0 5 6 0. 00 0 83 0 .0 0 0 9 6 0. 00 3 2 0. 00 3 2

0 .0 0 5 7 0 .0 0 5 6 0 .0 0 5 4 0 .0 0 6 1 0 .0 0 5 7 0 .0 0 7 1 0 .0 0 8 7 0.011 0. 03 1 0. 03 4 0. 07 4

0 .0 0 0 4 0 0 .0 0 0 7 7 0. 00 10 0 .0 0 0 7 1 0.0011 0. 00 12 0. 00 16 0. 00 23 0. 00 2 7 0. 00 90 0. 00 88

0 .0 1 6 0 .0 1 6 0 .0 1 5 0 .0 1 7 0 .0 1 6 0 .0 2 0 0 .0 2 4 0 .0 3 1 0. 08 7 0 .0 9 6 0. 21

` , , ` ` ` , , , , ` ` ` ` ` ` , , ` , , ` , ` , , ` -


6 Not for Resale

E572 − 13 TABLE 8 Titanium (%)

Material

Average ¯ X





7 2 3 5 9 10 6 1 4 11 8

0 .0 0 0 7 5 0 .0 0 0 8 7 0 .0 0 0 9 1 0. 00 14 0. 00 20 0. 00 20 8 0 .0 0 6 7 7 0. 00 91 0 .0 4 8 9 2 0 .1 0 1 6 0. 43 57

0 .0 0 0 3 4 0 .0 0 0 3 8 0 .0 0 0 4 5 0.0011 0. 00 3 2 0. 00 0 23 0 .0 0 0 7 0 0. 00 1 2 0 .0 0 0 9 2 0 .0 0 2 0 0. 00 2 5

0 .0 0 0 6 5 0 .0 0 1 3 0 .0 0 1 3 0 .0 0 1 4 0 .0 0 3 3 0 .0 0 1 2 0 .0 0 3 2 0 .0 0 5 5 0 .0 0 4 0 0 .0 0 6 7 0. 01 4

0 .0 0 0 9 4 0.0011 0. 00 12 0 .0 0 3 0 0 .0 0 8 9 0 .0 0 0 6 5 0. 00 20 0 .0 0 3 3 0. 00 26 0. 00 5 7 0. 00 70

0 . 00 1 8 0 . 0 03 6 0 . 0 03 7 0 .0 0 3 8 0 .0 0 9 3 0 . 00 3 3 0 . 0 09 1 0 .0 1 5 0.011 0. 01 9 0 .0 3 8

TABLE 9 Cobalt (%)

Material

Average ¯ X





11 3 10 2 5 6 7 8 1 4 9

0 .0 1 7 9 0. 02 38 0 .0 3 5 3 0. 04 74 0. 04 90 0. 05 34 0. 15 57 0. 22 20 0. 23 34 0. 29 22 0. 40 20

0.0011 0. 00 1 4 0 .0 0 1 7 0. 00 1 3 0. 00 1 5 0. 00 2 2 0. 00 2 1 0. 00 1 5 0. 00 2 7 0. 00 3 0 0. 00 2 0

0 .0 0 9 7 0. 01 2 0 .0 1 2 0. 01 7 0. 05 4 0. 06 0 0 .0 0 6 9 0 .0 0 4 8 0. 01 0 0. 02 6 0. 03 8

0. 00 3 0 0. 00 39 0 .0 0 4 8 0. 00 37 0. 00 41 0. 00 63 0 .0 0 5 9 0 .0 0 4 3 0. 00 75 0. 00 84 0. 00 55

0. 02 7 0 .0 3 3 0 .0 3 3 0 .0 4 9 0. 15 0. 17 0 .0 1 9 0 .0 1 3 0 .0 2 8 0 .0 7 2 0.11

TABLE 10 Sulfur (%)

Material

Average ¯ X





9 2 10 8 1 3 11 5 6 4 7

0 .0 0 2 3 9 0. 00 39 0 .0 0 4 1 0. 00 42 0. 00 86 0. 01 69 0 .0 1 8 8 0 .0 1 9 8 7 0. 02 25 0. 02 41 0. 24 94

0 .0 0 0 9 4 0. 00 1 5 0 .0 0 1 9 0. 00 2 0 0. 00 1 6 0. 00 3 1 0 .0 0 2 2 0 .0 0 0 9 4 0. 00 1 7 0. 00 1 7 0. 00 4 4

0 .0 0 2 7 0 .0 0 2 5 0 .0 0 2 3 0 .0 0 2 4 0 .0 0 2 0 0 .0 0 3 9 0 .0 0 4 6 0 .0 0 2 0 0 .0 0 6 7 0 .0 0 1 9 0. 02 1

0. 00 26 0 .0 0 4 1 0. 00 5 4 0 .0 0 5 5 0 .0 0 4 6 0 .0 0 8 6 0. 00 6 3 0. 00 26 0 .0 0 4 9 0 .0 0 4 8 0 .0 1 2

0 . 0 07 6 0 .0 0 7 1 0 .0 0 6 5 0 .0 0 6 7 0 .0 0 5 5 0.011 0. 01 3 0 . 0 05 6 0 .0 1 9 0 .0 0 5 4 0 .0 5 8

` , , ` ` ` , , , , ` ` ` ` ` ` , , ` , , ` , ` , , ` -


7 Not for Resale

E572 − 13 TABLE 11 Vanadium (%)

Material

Average ¯ X





5 11 1 2 9 7 6 3 4 8 10

0 .0 1 4 0 2 0. 02 39 2 0. 02 79 0 .0 5 6 6 3 0. 06 23 0 .0 7 0 9 0 0 .0 7 6 5 8 0 .0 9 0 4 9 0. 09 14 0. 13 72 0 .2 3 0 9

0 .0 0 0 6 5 0. 00 0 79 0. 00 1 6 0 .0 0 0 6 5 0. 00 1 0 0 .0 0 0 8 1 0 .0 0 0 9 8 0 .0 0 0 9 9 0. 00 1 0 0. 00 1 4 0 .0 0 2 4

0 .0 0 3 7 0 .0 0 3 7 0 .0 0 5 6 0 .0 0 5 3 0 .0 0 4 7 0 .0 0 4 2 0 .0 0 6 8 0 .0 0 5 8 0 .0 0 4 6 0 .0 0 8 9 0 .0 0 5 0

0. 00 18 0. 00 22 0 .0 0 4 3 0. 00 18 0 .0 0 2 9 0. 00 23 0. 00 27 0. 00 28 0 .0 0 2 9 0 .0 0 3 9 0. 00 6 7

0 .0 1 0 0 .0 1 0 0 .0 1 6 0 .0 1 5 0 .0 1 3 0 .0 1 2 0 .0 1 9 0 .0 1 6 0 .0 1 3 0 .0 2 5 0. 01 4

TABLE 12 Phosphorus (%)

Material

Average ¯ X





6 3 9 1 5 8 2 10 11 4 7

0. 01 09 0 .0 1 6 0 5 0. 01 65 0 .0 1 9 7 9 0. 01 98 0 .0 2 1 4 2 0. 02 29 0 .0 2 5 7 0 .0 2 6 2 0. 02 69 0. 02 76

0. 00 2 8 0 .0 0 0 7 6 0. 00 1 0 0 .0 0 0 7 7 0.0011 0 .0 0 0 9 6 0. 00 1 2 0 .0 0 4 5 0 .0 0 3 1 0. 00 2 9 0. 00 1 2

0 .0 0 4 2 0 .0 0 1 0 0 .0 0 2 8 0 .0 0 1 0 0 .0 0 1 5 0 .0 0 1 4 0 .0 0 1 4 0 .0 0 4 5 0 .0 0 4 8 0 .0 0 2 9 0 .0 0 1 7

0 .0 0 7 9 0. 00 21 0 .0 0 2 9 0. 00 22 0 .0 0 3 1 0. 00 27 0 .0 0 3 4 0 .0 1 3 0. 00 8 7 0 .0 0 8 1 0 .0 0 3 4

0 .0 1 2 0 . 0 02 8 0 .0 0 7 8 0 . 0 02 9 0 .0 0 4 2 0 . 0 04 1 0 .0 0 3 9 0 .0 1 3 0. 01 3 0 .0 0 8 1 0 .0 0 4 7

TABLE 13 Nickel (%) Material

Assumed True Value

Average Result

Deviation from Assumed True Value

3 2 11 7 5 8 1 10 6 4 9

0 .2 9 2 .1 6 3. 31 8 .1 4 9 .2 1 1 0. 01 1 0. 88 1 3 .1 0 1 8 .2 2 1. 15 3 4 .1

0 .2 4 3 6 2.118 3 .2 9 9 8. 15 6 9. 23 7 1 0 .0 5 3 1 0 .9 3 8 1 3 .2 4 7 1 8 .5 8 4 2 1 .1 9 2 34.114

-0.0464 -0.042 -0.011 0 .0 1 6 0 .0 2 7 0 .0 4 3 0 .0 5 8 0 .1 4 7 0. 38 4 0 .0 4 2 0. 01 4

TABLE 14 Chromium (%) Material

Assumed True Value

Average Result


6 2 7 8 1 5 11 9 10 3 4

2 .0 6 1 5. 64 1 7. 21 1 7. 68 1 7. 81 1 8. 09 1 8 .9 0 1 9. 81 2 1 .1 7 2 4. 14 2 3. 98

2. 06 7 1 5 .7 5 1 7 .3 0 4 1 7 .7 2 1 1 7 .8 8 6 1 8 .1 8 5 1 9 .0 5 0 1 9 .9 8 0 2 1 .2 5 3 2 4 .1 2 1 2 4 .1 5

0 .0 0 7 0.11 0 .0 9 4 0 .0 4 1 0 .0 7 6 0 .0 9 5 0 .1 5 0 0 .1 7 0 0 .0 8 3 -0.019 0. 16 8

` , , ` ` ` , , , , ` ` ` ` ` ` , , ` , , ` , ` , , ` -


8 Not for Resale

E572 − 13 TABLE 15 Manganese (%) Material

Assumed True Value

Average Result


3 2 9 5 11 1 6 8 4 7 10

0 .3 1 5 0 .4 2 0 .4 6 0 .7 8 8 0. 99 0 .9 6 1 .5 0 1 .6 3 1 .6 6 1 .6 8 5. 09

0. 31 2 0 0 .4 2 4 2 0 .4 4 3 0 0. 76 3 7 0. 95 9 3 0 .9 6 5 8 1 .4 6 6 6 1 .6 3 1 3 1 .6 5 8 7 1. 73 5 4 .9 4 3

-0.0030 0. 00 42 -0.0170 -0.0243 -0.0307 0. 00 58 -0.0334 0. 00 13 -0.0013 0 .0 5 5 -0.147

Assumed True Value

Average Result


0 .0 7 5 0 .1 0 4 0. 14 0 .1 6 2 0 .3 0 0 .3 6 0 .4 4 0 .5 8 3 .2 6

0 .0 2 9 6 0 .0 5 9 1 0. 08 09 0. 10 8 4 0. 13 5 3 0. 16 1 5 0 .3 1 0 4 0 .3 6 7 2 0 .4 4 1 9 0 .5 8 7 3 3. 29 1

0. 00 5 9 0 .0 0 4 4 -0.0047 -0.0005 0. 01 04 0. 00 72 0. 00 19 0. 00 73 0 .0 3 1

Average Result


TABLE 16 Copper (%) Material 5 3 10 1 11 2 8 7 6 4 9

TABLE 17 Molybdenum (%) Material 5 3 2 8 1 4 7 9 10 11 6

Assumed True Value

0 .0 0 3 8 0 .0 1 3 5 0. 16 5 9 0 .3 3 2 8 0 .4 3 3 4 0 .4 6 1 3 0 .5 6 6 0 2. 06 4 2 .2 0 5 2 .6 3 8 3. 09 6

0 .1 6 4 0 .3 3 0 .4 6 0 .5 5 2 .1 0 2. 19 2. 59 3 .1 5

0 .0 0 1 9 0. 00 28 0. 00 13 0. 01 60 -0.036 0. 01 5 0. 04 8 -0.054

TABLE 18 Silicon (%) Material

Assumed True Value

Average Result


9 10 8 5 2 7 3 11 1 4 6

0 .2 4 0. 32 0 .4 0 0 .5 2 0 .5 4 5 0 .5 8 0 .5 8 0. 67 0 .8 2 1 .6 6 1 .8 0

0 .2 5 6 4 0. 32 1 0 0 .3 9 4 7 0 .5 0 3 0 0. 55 2 2 0 .5 7 7 7 0 .5 9 7 8 0. 67 2 6 0. 82 5 1. 67 9 1. 78 9

0. 01 64 0 .0 0 1 0 -0.0053 -0.0170 0 .0 0 7 2 -0.0023 0. 01 78 0 .0 0 2 6 0 .0 0 5 0 .0 1 9 -0.011

` , , ` ` ` , , , , ` ` ` ` ` ` , , ` , , ` , ` , , ` -


9 Not for Resale

E572 − 13 TABLE 19 Niobium (%) Material 3 2 8 7 11 4 1 10 9 5 6

Assumed True Value

Average Result


0 .0 0 6 2 0 .0 1 4 7 0 .0 1 5 4 0 .0 1 6 5 0. 06 6 6 0. 07 1 9 0. 19 3 8 0. 21 3 4 0 .4 8 3 2 0. 94 3 1. 15 1

-0.0034 0 .0 2 1 9 0 .3 5 3 8 -0.0066 -0.0268 -0.047 -0.069

Average Result


0 .0 1 0. 07 0 .0 5 0 (0.16) 0. 22 0 .5 1 0 .9 9 1 .2 2

0. 00 54

TABLE 20 Titanium (%) Material 7 2 3 5 9 10 6 1 4 11 8

Assumed True Value

0 .0 0 2 0 .0 0 2 (0.01) 0 .0 5 0 0.11 0 .4 5

0. 00 0 75 0 .0 0 0 9 0 .0 0 0 9 0. 00 1 45 0. 00 2 0 0. 00 21 0 .0 0 6 8 0. 00 9 1 0. 04 8 9 0. 10 1 6 0. 43 6

-0.0011 -0.0084 -0.014

Average Result


0 .0 0 0 0 0. 00 0 1

TABLE 21 Cobalt (%) Material 11 3 10 2 5 6 7 8 1 4 9

Assumed True Value

0 .0 3 4

0 .1 6 0 .2 3 0 .2 2 0 .3 1 0 .4 1

0 .0 1 7 9 0. 02 4 0 .0 3 5 0. 04 7 0. 04 9 0. 05 3 0 .1 5 5 7 0 .2 2 2 0 0 .2 3 3 4 0. 29 2 0. 40 2

-0.0043 -0.0080 0. 01 34 -0.018 -0.008

0 .0 0 1

TABLE 22 Sulfur (%) Material

Assumed True Value

Average Result


9 2 10 8 1 3 11 5 6 4 7

0 .0 0 2 0 .0 0 1 0 .0 0 3 0. 00 18 0. 00 64 0 .0 1 5 0 .0 2 6 0 .0 1 9 0 .0 2 5 0 .0 2 4 0 .3 0 9

0. 00 2 39 0. 00 3 9 0. 00 41 0. 00 42 0. 00 86 0. 01 6 9 0. 01 88 0. 01 9 87 0. 02 2 5 0. 02 4 1 0. 24 9 4

0 .0 0 0 3 9 0 .0 0 2 9 0.0011 0. 00 2 4 0. 00 2 2 0 .0 0 1 9 -0.0072 0 .0 0 0 8 7 -0.0025 0 .0 0 0 1 -0.0596

--`,,```,,,,````-`-`,,`,,`,`,,`---


10 Not for Resale

E572 − 13 TABLE 23 Vanadium (%) Material 5 11 1 2 9 7 6 3 4 8 10

Assumed True Value

Average Result 0. 01 4 02 0 .0 2 3 9 2 0. 02 7 9 0. 05 6 63 0 .0 6 2 3 0. 07 0 90 0. 07 6 58 0 .0 9 0 4 9 0 .0 9 1 4 0 .1 3 7 2 0. 23 0 9

0 .0 3 0 0 .0 5 6 0 .0 5 9 0 .0 7

0 .0 8 0 .0 9 0 .1 3 0. 23

Deviation from Assumed True Value -0.00608 -0.0281 -0.00237 -0.0077

0. 01 04 9 0. 00 14 0. 00 72 0 .0 0 0 9

TABLE 24 Phosphorus (%)

` , , ` ` ` , , , , ` ` ` ` ` ` , , ` , , ` , ` , , ` -

Material

Assumed True Value

Average Result


6 3 9 1 5 8 2 10 11 4 7

0.011 0 .0 1 8 0 .0 1 8 0 .0 2 1 0 .0 1 8 0 .0 2 2 0 .0 2 6 0 .0 2 8 0 .0 2 7 0 .0 2 9 0 .0 3 0

0. 01 0 9 0. 01 6 05 0. 01 6 5 0. 01 9 79 0. 01 9 8 0. 02 1 42 0. 02 2 9 0. 02 57 0. 02 62 0. 02 6 9 0. 02 7 6

-0.0001 -0.00195 -0.0015 -0.00121 0 .0 0 1 8 -0.00058 -0.0031 -0.0023 -0.0008 -0.0021 -0.0024

ASTM International International takes no positi position on respecting the validi validity ty of any patent rights assert asserted ed in connec connection tion with any item mentio mentioned ned in this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the risk of infringement of such rights, are entirely their own responsibility. This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years and if not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standards and should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the responsible respon sible technical technical committee, which you may attend. If you feel that your comments have not receiv received ed a fair hearing you should make your views known to the ASTM Committee on Standards, at the address shown below. This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the above address addr ess or at 610610-832832-9585 9585 (pho (phone), ne), 610610-832832-9555 9555 (fax (fax), ), or serv service@ ice@astm astm.org .org (e-m (e-mail) ail);; or thro through ugh the ASTM webs website ite (www.astm. (www .astm.org). org). Permission Permission rights to photocopy the standa standard rd may also be secure secured d from the ASTM websit website e (www (www.astm. .astm.org/ org/ COPYRIGHT/).


11 Not for Resale

E572-13 -Standard Test Method for Analysis of Stainless and Alloy Steels by Wavelength Dispersive X-Ray Fluorescence Spectrometry.

Recommend Documents