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ANSI C63.15-2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
Accredited Standards Committee C63 ® —Electromagnetic Compatibility accredited by the
American National Standards Institute Secretariat
Institute of Electrical and Electronic Engineers, Inc. Approved 5 February 2010
American National Standards Institute
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Abstract: This Abstract: This immunity measurement and measurement instrumentation specification document complements the recommended procedures for making emission measurements as specified in ANSI C63.4. The immunity methods are alternative methods that might be of use to manufacturers who want to ensure a reliable product and reduce customer complaints by adding some additional immunity into their products beyond that required by law or by correcting problems experienced in the field not related to regulatory requirements. This document generally covers the frequency range of 30 Hz to 10 GHz. Keywords: electromagnetic Keywords: electromagnetic compatibility, EMC, immunity, RF immunity
________________________ _______________________ _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2010 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published Published 14 May 2010. Printed in the United States of America. America. C63 is a registered trademark in the U.S. Patent & Trademark Office, owned by the Accredited Standards Committee on Electromagnetic Compatibility. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics Engineers, Incorporated.
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American National Standard An American National Standard implies a consensus of those substantially concerned with its scope and provisions. An American National Standard is intended as a guide to aid the manufacturer, the consumer, and the general public. The existence of an American National Standard does not in any respect preclude anyone, whether he has approved the standard or not, from manufacturing, marketing, purchasing, or using products, processes, or procedures not conforming to the standard. American National Standards are subject to periodic review and users are cautioned to obtain the latest editions. CAUTION NOTICE: This American National Standard may be revised or withdrawn at any time. The procedures of the American National Standards Institute require that action be taken to reaffirm, revise, or withdraw this standard no later than five years from the date of publication. Purchasers of American National Standards may receive current information on all standards by calling or writing the American National Standards Standards Institute.
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Errata Users are encouraged to check the IEEE Errata URL ( http://standards.ieee.org/ (http://standards.ieee.org/ reading/ieee/updates/errata/index.html), reading/ieee/updates/errata/index.html ), and the one for ASC C63 ® at http://www.c63.org/ explanations_interpretations_request.htm, for errata periodically.
Interpretations Current interpretations can be accessed explanations_interpretations_request.htm.
at
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http://www.c63.org/
For more information about the committee that produced and maintains this standard, visit the ANSI Accredited Standards Committee C63 ® web site at http://www.c63.org http://www.c63.org..
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Introduction This introduction is not part of ANSI C63.15-2010, American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment. In the early 1980s, televisions received their signals only over the air because cable and satellite reception was not available. The tuners had only limited limited shielding, if any. RF signals signals from a variety of sources outside the TV bands interfered with TV reception. In 1982, legislation passed by the U.S. Congress and President Reagan (Public Law 97-259) giving the FCC the authority to require that home electronics equipment would have to meet RFI susceptibility standards. This stemmed from the work at the time of Senator Barry Goldwater and House Representative Charles Vanik. Senator Goldwater was himself an amateur radio operator and certainly aware of the need for immunity of home electronics especially to licensed broadcasters using frequencies outside of the TV bands. At the time, ASC C63 ® was asked by the FCC to work with the Electronics Industry Association (EIA) to see if there was a way to add immunity to TVs by the manufacturer so as not to require FCC regulations. A task force in ASC C63 ® Subcommittee 1 was set up to address this matter. After extensive discussions, the TV industry came up with designs that significantly increased the immunity of TVs to out of band signals. This was one of the first times that the voluntary standards community helped to solve a problem without the need for regulations. The above background served to set the stage for the interest in ASC C63 ® to consider preparing immunity standard test methods. As such the project was approved in Subcommittee Subcommittee 1 in the 1980s, for an addition to ANSI C63.4 for measurement methods, and an addition to ANSI C63.2 for measurement instrumentation. Don Heirman was named as the chairman of the WG on Immunity with the assistance of Ray Magnuson. A ballot was then taken of the work in 1983. The ballot had many comments but more importantly eight negative votes. Work then proceeded to resolve the comments. Bill Hayes took over the measurement instrumentation portion of the task at that time. In parallel there was also major activity in immunity measurement methods starting in the IEC arena. This required decisions on how to proceed with the work of ASC C63 ®. The outcome was that the ASC C63 ® work on immunity was stalled for several years. However the WG did contribute in this time frame to the military work on commercial off the shelf (COTS) procurements, procurements, as well as immunity text for ANSI C63.12 in the mid-1990s. Further revisions were made to the C63® draft during this time, headed by Steve Bloom, but at a slow rate because the work in the IEC was gaining speed. In early 2000, another draft was ready for ballot. The ballot was taken and the document still failed to get sufficient approval votes. At that time, Herb Mertel assumed the WG chairmanship working to prepare another draft taking into account the comments that would require extensive changes to the draft standard. The Subcommittee 1 projects were called project 1-1.1 (Immunity measurement methods) and project 1-1.3 (Immunity instrumentation) for development of the overall standard C63.15. By 2003, the projects were combined into one document and given the number C63.15 as early as 1999. It was identified as a recommended practice. In 2004, Mike Windler took over the task of editing the document. The ballot again failed in 2005 with substantial negative comments. At that time the project was shifted to Subcommittee Subcommittee 5 because that that subcommittee deals with with immunity standards. In 2006, the last ballot was taken and this time it passed in the parent committee. The final editing was completed in Fall of 2008, with ANSI and IEEE processing completed for publication in 2010. The above scenario has been compiled from a variety of documents and sources. It is considered as a reasonable trail of the activity to publish with this document.
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Errata Errata, if any, for this and all other standards can be accessed at the following URL: http://standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically.
Interpretations Current interpretations can be accessed at the following URL: http://standards.ieee.org/reading/ieee/interp/ index.html.
Patents Attention is called to the possibility that implementation of this recommended practice may require use of subject matter covered by patent rights. By publication of this recommended practice, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this recommended practice are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.
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Participants At the time this recommended practice was published, the Accredited Standards Committee C63 ® — Electromagnetic Compatibility had the following membership: Donald N. Heirman, Chair Daniel Hoolihan, Vice Chair Jerry Ramie, Secretary Michael D. Kipness, Secretariat Organization Represented
Name of Representative
Alcatel–Lucent Technologies ............................................................................................................... Dheena Moongilan Alliance for Telecommunications Industry Solutions (ATIS)........................................................................ Mel Frerking ..............................................................................................................................................................James Turner (Alt.) American Council of Independent Laboratories (ACIL) ......................................................................Michael F. Violette ..........................................................................................................................................................William Stumpf (Alt.) American Radio Relay League (ARRL) .................................................................................................... Edward F. Hare ........................................................................................................................................................... Dennis Bodson (Alt.) AT&T ......................................................................................................................................................... George Hirvela .............................................................................................................................................................David Shively (Alt.) Bureau Veritas .................................................................................................................................................... Jon Curtis ........................................................................................................................................................ Jonathan Stewart (Alt.) Cisco Systems...........................................................................................................................................Werner Schaefer Dell Inc. ..................................................................................................................................................... Richard Worley ETS-Lindgren ..........................................................................................................................................Michael Foegelle ................................................................................................................................................................Zhong Chen (Alt.) Federal Communications Commission (FCC) ..............................................................................................William Hurst Food and Drug Administration (FDA)...................................................................................... Jeffrey L. Silberberg (Alt.) Information Technology Industry Council (ITIC) .......................................................................................... John Hirvela .......................................................................................................................................................Joshua Rosenberg (Alt.) Institute of Electrical and Electronics Engineers, Inc. (IEEE) ............................................................. Donald N. Heirman IEEE-EMCS .......................................................................................................................................... H. Stephen Berger ........................................................................................................................................................ Donald Sweeney (Alt.) Motorola ........................................................................................................................................................ Tom Knipple ..............................................................................................................................................................Scott Isabelle (Alt.) National Institute of Standards and Technology (NIST)..............................................................................Dennis Camell Polycom .......................................................................................................................................................... Jeff Rodman ............................................................................................................................................................ Tony Griffiths (Alt.) Research in Motion (RIM) .............................................................................................................................Paul Cardinal ..............................................................................................................................................................Masud Attayi (Alt.) Samsung Telecommunications ...................................................................................................................... Tony Riveria ............................................................................................................................................................. Kendra Green (Alt.) Society of Automotive Engineers (SAE) ..................................................................................................... Poul Andersen ...............................................................................................................................................................Gary Fenical (Alt.) Sony Ericsson Mobile Communications........................................................................................................Gerard Hayes .............................................................................................................................................................. Steve Coston (Alt.) Telecommuication Certification Body (TCB) Council ..........................................................................................Art Wall .................................................................................................................................................................Bill Stumpf (Alt.)
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Telecommunications Industry Association (TIA) ...................................................................................Stephen Whitesell TUV-America, Inc. ............................................................................................................................... David Zimmerman Underwriters Laboratories ....................................................................................................................Michael J. Windler .............................................................................................................................................................. Robert Delisi (Alt.) U.S. Department of Defense—Joint Spectrum Center .............................................................................Marcus Shellman ............................................................................................................................................................ Joseph Snyder (Alt.) U.S. Department of the Navy—SPAWAR ............................................................................................ David Southworth Individual Members.................................................................................................................................. Daniel Hoolihan .........................................................................................................................................................................John Lichtig ............................................................................................................................................................... Ralph M. Showers Members Emeritus ................................................................................................................................ Warren Kesselman ................................................................................................................................................................ Herbert K. Mertel .......................................................................................................................................................... H. R. (Bob) Hofmann
During the time this recommended practice was completed, the SC-5 and SC-1 Project Working Groups had the following membership: Herbert K. Mertel, Chair Michael J. Windler*, Technical Editor Steve Bloom* Colin Brench Edwin L. Bronaugh Joseph Butler Al Chiaravallo Dave Cofield Mike L. Crawford Tim D’Arcangelis* Glen Dash R. H. Davis Donald Friesen
Richard Gawrelski Ross Hansen* Tim Harrington (editor) E. Heise William K. Hayes* Donald N. Heirman* William Krueger John Lichtig Ray Magnuson Al Parker
Walter A. Poggi William T. Rhodes Peter Richman Dan W. Roth T. Rybak Ralph M. Showers Jeffrey L. Silberberg George Sintchak Mike Tedaldi E. M. Tingley Barry Wallen
* Also served as Project Leader during part of the development time.
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Contents 1. Scope ..........................................................................................................................................................
1
2. Normative references.................................................................................................................................. 2
3. Definitions.................................................................................................................................................. 3
4. General requirements.................................................................................................................................. 4 4.1 Safety precautions .................................................................................................................................... 4.2 Input power requirements......................................................................................................................... 4.3 Measurement tolerances ........................................................................................................................... 4.4 Annexes.................................................................................................................................................... 4.5 Test reports ...............................................................................................................................................
4 4 4 5 5
5. Conducted immunity .................................................................................................................................. 5 5.1 CI-1: Power-line immunity, 30 Hz to 150 kHz ........................................................................................ 5 5.2 CI-2: Power-line and signal-line immunity, bulk current injection, 10 kHz to 200 MHz ........................ 6 5.3 CI-3: Communications receiver antenna input immunity (receivers other than broadcast), 30 Hz to 10 GHz.................................................................................................................................. 6 5.4 CI-4: Receiver antenna input immunity for TVs and VCRs, 0.5 MHz to 30 MHz ................................ 10 5.5 CI-5: Power/interconnection line surge voltage ..................................................................................... 10 5.6 CI-6: Electrical fast transient/burst......................................................................................................... 11 5.7 CI-7: Telecommunications terminal equipment line voice band line immunity, 10 kHz to 30 MHz..... 12 5.8 CI-8: Telecommunications telephone terminal equipment, immunity requirements for equipment having an acoustic output, 150 kHz to 30 MHz ............................................................... 17 6. Radiated immunity ................................................................................................................................... 18 6.1 RI-1: Uniform magnetic field immunity, Helmholtz coil, 30 Hz to 100 kHz ......................................... 6.2 RI-2: Magnetic field immunity, point source, 30 Hz to 100 kHz ........................................................... 6.3 RI-3: Power frequency magnetic induction field.................................................................................... 6.4 RI-4: Spikes-inductive field immunity ................................................................................................... 6.5 RI-5: Electric field immunity in a TEM cell, 10 kHz to 80 MHz........................................................... 6.6 RI-6: Electric field immunity, 80 MHz to 10 GHz.................................................................................
18 19 19 21 23 23
Annex A (informative) Immunity testing tutorial......................................................................................... 25 A.1 Basic issues............................................................................................................................................ A.2 Immunity environment .......................................................................................................................... A.3 Immunity trade-offs............................................................................................................................... A.4 Present day radiated immunity test facilities ......................................................................................... A.5 Immunity compliance criteria................................................................................................................ A.6 Other performance degradation concepts ..............................................................................................
25 25 26 26 28 31
Annex B (informative) Recommended test equipment for measurement methods where measurement procedure is in a referenced document .............................................................................................. 32 B.1 Test equipment recommended for method CI-1: power-line immunity................................................. 32
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B.2 Test equipment recommended for method CI-2: power-line and signal-line immunity, bulk current injection......................................................................................................................... 32 B.3 Test equipment recommended for CI-4: receiver antenna input immunity for TVs and VCRs............. 33 B.4 Test equipment recommended for method CI-5: power-line surge voltage test (IEC 61000-4-5)......... 33 B.5 Test equipment recommended for method CI-6: electrical fast transient test (IEC 61000-4-4) ............ 33 B.6 Test equipment recommended for method CI-8: telecommunications equipment with an acoustic output, 150 kHz to 30 MHz ................................................................................................. 34 B.7 Test equipment recommended for method RI-1: magnetic field immunity, Helmholtz coil ................. 35 B.8 Test equipment recommended for method RI-2: magnetic field immunity, point source...................... 36 B.9 Test equipment and other considerations recommended for method RI-5: electric field immunity, 10 kHz to 80 MHz (TEM cell method per NBS TN 1013) ................................................................ 37 B.10 Test equipment recommended for RI-6: electric field immunity, 80 MHz to 10 GHz (IEC 61000-4-3)................................................................................................................................ 39
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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http://standards.ieee.org/IPR/disclaimers.html .
1. Scope The conducted immunity (CI) and radiated immunity (RI) test methods in this recommended practice do not universally apply to every product. Applicable test methods should be selected. A qualified EMC engineer should document test planning and the rationale for using particular immunity tests. This document is intended to a)
Identify preferred or optional immunity test methods.
b)
Describe specific measurement techniques.
c)
Suggest product performance degradation criteria as applicable to general and specific products.
d)
Identify test instrumentation specifications.
Wherever possible, existing voluntary standards are utilized and summarized. It should be noted that the techniques listed herein should in no way limit the user to a particular method to increase product immunity. The immunity levels in this document are recommended. Should product classifications and type have other immunity levels that apply, they shall take precedence. Equipment developed for military applications should use MIL-STD-461E1 or later editions for test procedures and limits.
1
Information on references can be found in Clause 2.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
2. Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. ANSI C63.2, American National Standard Specifications for Electromagnetic Noise and Field Strength Instrumentation, 10 Hz to 40 GHz Specifications.2 ANSI C63.12, American National Standard, Recommended Practice for Electromagnetic Compatibility Limits. ANSI C63.14, American National Standard Dictionary of Electromagnetic Compatibility (EMC) including Electromagnetic Environmental Effects (E3). ANSI/EIA-544, Immunity of TV and VCR Tuners to Internally Generated Harmonic Interference from Signals in the Band 535 kHz to 30 MHz. 3 ANSI/TIA-470A, Telephone Instruments with Loop Signaling. ANSI/TIA-579, Acoustic-To-Digital and Digital-To-Acoustic Transmission Requirements for ISDN Terminals. ANSI/TIA/EIA-631, Telecommunications Telephone Terminal Equipment Radio Frequency Immunity Requirements for Equipment Having an Acoustic Output. CEA-31, Design Guideline—Rejection of Educational Interference to Ch 6 Television Reception. 4 EIA Interim Standard No. 16, Immunity of TV Receivers and Video Cassette Recorders (VCRs) to Direct Radiation from Radio Transmissions, 0.5 to 30 MHz. 5 EIA/CEMA/TV/VCR SET, TV/VCR Receiver Immunity Set. IEC 61000-4-3:2006, Testing and measurement techniques—Section 3: Radiated, radio-frequency electromagnetic field immunity test. 6 IEC 61000-4-4:2006, Testing and measurement techniques—Section 4: Electrical fast transient/burst immunity test. IEC 61000-4-5:2005, Testing and measurement techniques—Section 5: Surge immunity test.
2
C63 ® publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA, or from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA. (http://standards.ieee.org/). 3 ANSI publications are available from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http://www.ansi.org/). 4
CEA publications are available from Global Engineering Documents, 15 Inverness Way East, Englewood, CO 80112, USA (http://global.ihs.com/). 5
EIA publications are available from Global Engineering Documents, 15 Inverness Way East, Englewood, CO 80112, USA (http://global.ihs.com/). 6
IEC publications are available from the Sales Department of the International Electrotechnical Commission, Case Postale 131, 3, rue de Varembé, CH-1211, Genève 20, Switzerland/Suisse (http://www.iec.ch/). IEC publications are also available in the United States from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:// www.ansi.org/).
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
IEC 61000-4-6:2001, Testing and measurement techniques—Section 6: Immunity to conducted disturbances, induced by radio-frequency fields. IEC 61000-6-1, Electromagnetic Compatibility (EMC)—Part 6: Generic Standards—Section 1: Immunity for Residential, Commercial and Light-Industrial Environments. IEC 61000-6-2, Electromagnetic compatibility (EMC) Part 6-2: Generic standards Immunity for industrial environments. IEEE Std 299™, IEEE Standard Method for Measuring the Effectiveness of Electromagnetic Shielding Enclosures.7, 8 IEEE Std C95.1™, IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz. ISO/IEC 17025, General Requirements for the Competence of Calibration and Testing Laboratories.9 MDS-201-0004, Electromagnetic Compatibility Standard for Medical Devices (http://www.fda.gov/cdrh/ode/638.pdf). MIL-HDBK-454A, Department of Defense Handbook, General Guidelines for Electronic Equipment.10 MIL-STD-461E, Requirements for the Control of Electromagnetic Interference Characteristics of Subsystems and Equipment (http://www.jsc.mil/jsce3/emcslsa/stdlib/LibDisplay.asp?folder=ms). MIL-STD-462, Department of Defense Test Method Standard for Measurement of Electromagnetic Interference Characteristics. NBS TN-1013, July 1981: Using a TEM Cell for EMC Measurements of Electronic Equipment, Crawford, M. L.; Workman, J. L. 11 RCTA DO-160E, Radio Technical Committee for Aircraft, Environmental Conditions and Test Procedures for Airborne Equipment (http://www.rtca.org/).
3. Definitions
The definitions in ANSI C63.14 apply. Definitions in particular product standards or in applicable regulations take precedence. dBrnC: Noise power above a reference noise measured by a set with C-message weighting. dBSPL: Sound pressure level relative to a particular noise as a reference source.
7
IEEE publications are available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ 08854, USA (http://standards.ieee.org/). 8
The IEEE standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc.
9
ISO/IEC publications are available from the ISO Central Secretariat, 1, ch. de la Voie-Creuse, Case postale 56, CH-1211 Geneva 20, Switzerland (http://www.iso.ch/). ISO/IEC publications are also available in the United States from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http://www.ansi.org/). 10 MIL publications are available from Customer Service, Defense Printing Service, 700 Robbins Ave., Bldg. 4D, Philadelphia, PA 19111-5094. 11
This NBS publication is no longer in publication. However, a copy of this standard is available at some university libraries as well as from the IEEE-SA.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
4. General requirements
4.1 Safety precautions WARNING
Electric Shock Hazard: Precautions against electric shock hazard should be taken when ac-operated test instrumentation is used and when test instrumentation is connected to power circuits. There are numerous requirements for leakage currents and the precautions given in manufacturers’ manuals and local codes need to be considered. The following are two examples: In MIL-HDBK-454A, it is specified that in normal use if the open circuit potential to ground is more than 25 V (ac) and the current with a 1500 Ω load is more than 4 mA (dc) and 1 mA (ac) a shock hazard exists. In Europe this amplitude is 0.75 mA for handheld equipment and 3.5 mA for floor standing equipment.
WARNING
Nonionizing Radiation Exposure Hazard: IEEE Std C95.1 specifies safety levels and guidelines with respect to human exposure to radio frequency electromagnetic fields. Fields that exceed these safety levels are possible when using the test instrumentation in this recommended practice, particularly when the test instrumentation is used to perform radiated immunity testing. Precautions against exposing personnel to these electromagnetic fields should be taken.
4.2 Input power requirements If the test instrument requires ac power, it should operate on a supply that meets its specifications for voltage and frequency. The test instrumentation should have adequate power-line filtering to prevent erroneous or undesirable operation due to power-line interference.
4.3 Measurement tolerances The general tolerances are derived from MIL-STD-461E. Unless otherwise stated for a particular measurement, the tolerance of the value stated shall be as follows: a) b) c) d) e) f) g)
Distance: ± 5% Frequency: ± 2 % Amplitude, measurement receiver: ± 2 dB Amplitude, measurement system (includes measurement receivers, transducers, cables, etc.): ±3 dB Time (waveforms): ± 5 % Resistance: ± 5 % Capacitance: ± 20 % 4 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
4.4 Annexes The annexes provide a tutorial on immunity, a view of performance degradation criteria and the recommended test equipment (Annex B) for test methods that were obtained from the obsolete and detailed reference documents.
4.5 Test reports The test report shall provide the following: a)
Graphical or tabular data showing the frequencies and amplitudes at which the test was performed
b)
Data on any immunity threshold and the associated frequencies that were determined for each immunity test
c)
Indication of compliance for each test in a summary table
d)
Measurement uncertainty if applicable (see ISO/IEC 17025 for guidance)
5. Conducted immunity Conducted interference may degrade electronic product operation as it enters the product via ac power, dc power, signal, communication, telemetry lines, and receiver antenna input. Hence, these lines must be immune to common conducted interfering signals comprised of steady-state, transient, and other signal types typically found in radio frequency (RF) ambient and product locations.
5.1 CI-1: Power-line immunity, 30 Hz to 150 kHz
5.1.1 General considerations This test method is used to verify the ability of the equipment under test (EUT) to withstand ripple voltages present on power leads. Since the applied voltage is coupled in series using a transformer, Kirchhoff’s voltage law requires that the voltage appearing across the transformer output terminals must drop around the circuit loop formed by the EUT input and the power source impedance. The voltage specified by the product specification is measured across the EUT input because part of the transformer voltage can be expected to drop across the source impedance.
5.1.2 Measurement procedure Use the measurement procedure given in Method CS101, MIL-STD-461E.
5.1.3 Performance degradation Performance criterion should be established using the guidelines described in Annex A.
5.1.4 Suggested immunity levels The suggested immunity level is shown in Figure CS 101-1 of MIL-STD-461E, Curve 1.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
This limit is 136 dBµV (6 V) from 30 Hz to 5 kHz on lines greater than 28 V and decreases as a log function (linear on a log scale) to 106.5 dBµV (0.21 V) at 150 kHz. NOTE—Test voltages are in terms of the rms value of a sine wave.
5.2 CI-2: Power-line and signal-line immunity, bulk current injection, 10 kHz to 200 MHz
5.2.1 General considerations This test method is used to verify the ability of the EUT to withstand RF signals present on interconnecting cables, including power leads. This type of test is often considered a bulk current test because current is the parameter measured. However, it is important to note that the test signal is inductively coupled and that Faraday’s law predicts an induced voltage in a circuit loop with the resultant current flow and voltage distribution dependent on the various impedances present. This method induces levels on all wires at a connector interface simultaneously (common mode) which simulates actual use. Testing is required on both entire power cables and power cables with the neutral or grounded conductors removed to evaluate common-mode coupling to configurations that may be present in different installations. In some installations, the neutral or grounded wire is routed with the line conductor. In other installations, neutrals or grounded conductors are tied to the grounded system structure near the utilization equipment. The entire grounded system structure is being used as the power return path.
5.2.2 Measurement procedure Use the measurement procedure given in Method CS114, MIL-STD-461E to 200 MHz. Optionally, IEC 61000-4-6 may be used over the frequency range of 150 kHz to 230 MHz.
5.2.3 Suggested immunity level The suggested immunity level is shown in Curve 3 of Figure CS 114-1 of MIL-STD-461E. It is 49 dBµA (282 µA) at 10 kHz increasing to 89 dBµA (28 mA) at 1 MHz to 30 MHz and it is decreasing to 77 dBµA (7 mA) at 400 MHz.
5.3 CI-3: Communications receiver antenna input immunity (receivers other than broadcast), 30 Hz to 10 GHz
5.3.1 General considerations This test method is applicable for determining the immunity or front-end rejection of receivers operating in the frequency range of 30 Hz to 10 GHz. This test method is derived from an earlier version of MIL-STD-462 that is no longer available.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
5.3.2 Immunity signal The EUT should be subjected to the signal levels as defined by Figure 1. With regard to Figure 1, note the following: a) The limit at A is 80 dB above the input level required to produce the standard reference output. b)
The limit at B should be 0 dBm applied directly to the receiver input terminals. Caution is advised that 0 dBm may be too severe for certain receivers. For example, a receiver with a sensitivity of 1 mV will require 107 dB of rejection outside the tuning band, which is a severe requirement.
5.3.3 Test setup and procedure The following steps should be used as a test procedure: a)
Use the general setup as shown in Figure 2. With the EUT operating and Signal Source No. 2 turned off, tune Signal Source No. 1 to f 0, which should be the receiver-tuned frequency.
b)
Adjust the output of Signal Source No. 1 to produce the standard reference output at the receiver. NOTE—The “standard reference” is to be specified by the manufacturer. It could be the receiver sensitivity.
c)
Record the un-modulated output level and frequency of Signal Source No. 1.
d)
Set the modulation for Signal Source No. 1 so as to produce the standard reference output as required by the receiver specification.
e)
Repeat steps a) through d) using Signal Source No. 2 with Signal Source No. 1 switched off.
f)
For the remainder of the test, have Signal Source No. 1 on and modulated as in step d), and have Signal Source No. 2 on but un-modulated.
g)
Set Signal Source No. 1 with its proper modulation to the frequency and level as initially determined and set Signal Source No. 2, with no modulation, to the levels shown in Figure 1.
h)
The frequency limits are such that the lowest test frequency should be the lower of IF/5 or 0.05 f 0, where IF is the receiver IF frequency and f 0 is the receiver-tuned frequency. For multiple conversion receivers, select the lowest IF.
i)
The highest frequency for this test should be the higher of 5 × f LO + IF or 20 f 0 (but less than 10 GHz) where f LO is the receiver local oscillator frequency, f 0 the receiver-tuned frequency, and IF is the receiver intermediate frequency.
j)
For multiple conversion receivers the f LO and IF should be the highest frequencies associated with the receiver.
k)
For receivers with waveguide input, the lowest test frequency should be 0.8 f CO where f CO is the waveguide cut-off frequency.
l)
Note that the frequency range defining the 80 dB selectivity points (w in Figure 1) is exempt from this test.
m) While scanning the required frequency range with Signal Source No. 2, note any receiver responses. n)
Check to make sure that the response noted is a spurious one and not due to an inter modulation product. Reducing the level of Signal Source No. 1 to see if the response disappears can do this. If it does not disappear, then it is a true spurious response.
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o)
After determining that a true spurious response has been found, returning Signal Source No. 1 to its original level and reduce the level of Signal Source No. 2 until the standard receiver reference output is obtained. The difference, in dB, between this level on Signal Source No. 2 and the level determined initially on Signal Source No. 2 at the receiver-tuned frequency, is the spurious response rejection.
p)
Record frequency and level of Signal Source No. 2.
Signal Source No. 1 should always be modulated in the same manner as specified in the section pertaining to receiver sensitivity measurements of the detailed equipment specification. When the equipment specification does not define this, the following should be used: — AM receivers: The signal generator should be 80 % modulated by a 1 kHz sine wave. — SSB and FM receivers: The signal generator should be un-modulated. — Pulse receivers: The modulation pulse should be adjusted so that 80 % of its spectral energy lies within the 3 dB bandwidth of the receiver. The signal generators emit a substantial amount of harmonics and other spurious energy. Care should be taken not to mistake an emission of the generator falling on f 0 for a spurious response of the equipment. It is possible to have spurious responses at f 0/2, f 0/3, f 0/4, etc. that are not due to generator harmonics. In order to guard against the effects of signal generator harmonics, it is necessary to use high- and low-pass filters as necessary throughout the test. Consideration must be given to the number of receiver-tuned frequencies to be considered for this test on a given piece of equipment as well as the number of receiver-tuning steps. The standard reference output should be defined for this test. A possible reference might be an output that produces 30 dB quieting, or 10 dB signal (S ) plus noise ( N ) plus distortion ( D) divided by noise plus distortion, i.e., (S + N + D)/( N + D). A suitable test for receiver image frequency rejection may be appropriate.
5.3.4 Performance degradation The pass/fail criterion for this test is that the EUT should demonstrate the front-end receiver rejection of undesired signals as defined in Figure 1.
5.3.5 Test equipment The test equipment required to perform this test is as follows: a)
b)
Signal generator (two may be required) 1)
Frequency range: 10 kHz to 10 GHz
2)
Frequency accuracy: ± 1 %
3)
Output voltage range: Standard reference + 80 dB [Example: Standard reference = 0 dBµV (–107 dBm) to 80 dBµV (–27 dBm)]
4)
Harmonic and spurious signal: more than 30 dB down from fundamental. External filtering may be needed to meet this requirement.
5)
Modulation characteristics: FM CW, AM to 1 GHz, pulse above 200 MHz
Low- and high-pass filters (to remove signal generator harmonics as required) 1)
Impedance: 50 Ω
2)
Power rating: 1 W or greater 8 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
c)
d)
Power splitters (three-port network) 1)
Frequency range: dc to 10 GHz (several types may be required)
2)
Insertion loss: < 6 dB
3)
Impedance: 50 Ω
4)
Power rating: 1 W or greater
Attenuators (two required, one each at output of signal sources) 1)
Frequency range: dc to 10 GHz
2)
Impedance: 50 Ω
3)
Power rating: 1 W or greater
4)
Attenuation: 10 dB
Figure 1 —Test signal definitions f 0 = f 1 = f 2 = w=
Receiver-tuned frequency Lowest tunable frequency of receiver band in use Highest tunable frequency of receiver band in use Bandwidth between 80 dB points of the receiver selectivity curve as defined in the test sample technical requirements or the control plan
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Figure 2 —CI-3 Communications receiver antenna input immunity general test setup
5.4 CI-4: Receiver antenna input immunity for TVs and VCRs, 0.5 MHz to 30 MHz 5.4.1 General considerations The purpose of this test is to demonstrate that the TV or VCR is immune to signals other than the intended signal at its RF input terminals.
5.4.2 Measurement procedure Use the measurement procedures given in ANSI/EIA 544, CEA-31, EIA IS-16, and EIA/CEMA/TV/VCR SET, TV/VCR Immunity Set.
5.5 CI-5: Power/interconnection line surge voltage
5.5.1 General considerations The purpose of this test is to determine if the EUT is immune to high-energy disturbances on power-lines and interconnecting power-lines as a result of transients caused by switching systems or lightning.
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5.5.2 Measurement procedure Use the measurement procedure given in IEC 61000-4-5.
5.5.3 Suggested immunity level The suggested immunity level can be selected from Table 1. All the test levels below the suggested level should also be tested. The suggested level for power-lines is 1 kV line-to-line and 2 kV lines to protective earth. Signal lines are generally not surge tested.
Table 1 — Test severity levels Open circuit test voltage kV (± 10 %) 0.5 1.0 2.0 4.0 Special
Level
1 2 3 4 X
NOTE— “X” is an open level. This level must be specified in the product specification.
5.6 CI-6: Electrical fast transient/burst 5.6.1 General considerations The purpose of this test is to determine if the EUT is immune to repetitive fast transients (bursts), on supply, signal, and control ports as a result of transient disturbances caused by switching transients (interruption of loads, relay contact bounce, etc.).
5.6.2 Measurement procedure Use the measurement procedure given in IEC 61000-4-4.
5.6.3 Suggested immunity level The suggested immunity level is Level 2 for signal and power-lines in accordance with Table 2.
Table 2 —Test voltages On power supply port, PE Level
1 2 3 4 X
Voltage peak kV 0.5 1 2 4 Special
Repetition rate kHz 5 or 100 5 or 100 5 or 100 5 or 100 Special
On I/O (input /output) signal data and control ports Voltage peak Repetition rate kV kHz 0.25 5 or 100 0.5 5 or 100 1 5 or 100 2 5 or 100 Special Special
NOTE 1—Use of 5 kHz repetition rates is traditional; however, 100 kHz is closer to reality. Product committees should determine which frequencies are relevant for specific products or product types. NOTE 2—With some products, there may be no clear distinction between power ports and I/O ports, in which case it is up to product committees to make this determination for test purposes. NOTE 3—“X” is an open level. The level must be specified in the dedicated equipment specification.
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5.7 CI-7: Telecommunications terminal equipment line voice band line immunity, 10 kHz to 30 MHz 5.7.1 General considerations The purpose of this test is to determine the immunity level of the EUT to conducted electromagnetic energy that may be present at the telecommunications network interface (NI). It should be noted that RF energy may also couple to customer-owned premises wire or be radiated directly into the terminal equipment.
5.7.2 Immunity signal The test signal should be swept from 10 kHz to 30 MHz and be 80 % amplitude modulated by a 1 kHz sinusoidal signal.
5.7.3 Test set-up and procedure The test circuit used for the measurements is shown in Figure 5. The –48 Vdc provided to the EUT by the central office battery is simulated by a –48 Vdc power supply that includes a 200 Ω resistor on each output conductor. An RF filter is used to prevent the test signal from entering the power supply. To simulate the variations of dc voltage and current at the EUT due to loop length, the “loop resistance simulator” provides either zero resistance (e.g., subscribers near central office—short loops) or 1200 Ω (600 Ω per conductor) to simulate long loops. Two RF signal injection circuits are used. As shown in Figure 6 and Figure 7, one circuit is used to inject differential-mode signals and the other to inject common-mode signals. The differential-mode and common-mode impedance of these circuits are 135 Ω for differential-mode and 90 Ω for common-mode, are as described in Figure 3. The termination should be allowed to have 100 Ω metallic impedance and 90 Ω longitudinal impedance above 6 MHz. By inserting a variable capacitor from one side of the circuit to ground (see Figure 7), an unbalance to ground is created and a differential-mode signal results from an injected common-mode signal. A transmission test set is used to monitor the noise level, in dBrnC, of the RF signal demodulated by the EUT. An RF filter should be used at the input of the transmission test set to prevent demodulation of the RF signal by the transmission test set. Measurement of the interfering signal is done with a termination network (see Figure 3 and Figure 4) in place of the EUT, and with a receiver having an input impedance of 50 Ω. All reference points (RPs) are connected to a metallic reference plane on which the EUT is placed (see Figure 5). The purpose of the reference plane is to provide a capacitive path for common-mode signals, because EUTs may not have a connection to ground. Measurements should be made with the EUT in the on-hook and off-hook states. If the EUT is supplied with a microphone, the microphone should be muffled to reduce the ambient voice band noise pickup. The EUT should be tested with the following signals: — Differential-mode signal only — Common-mode signal only — Common-mode signal with a capacitive unbalance to the reference point to generate a differential-mode signal (see Figure 7) 12 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
The injected signal is increased until 20 dBrnC of noise (demodulated 1 kHz signal) is measured at the transmission test set with the EUT connected. Then, without changing signal levels from the RF signal injection circuit, the EUT is substituted by the termination network that provides reference differentialmode and common-mode impedances. Voltage measurements (differential-mode and common-mode) of the injected signal across the termination network are then made with the receiver. Measurement of conducted RF should be recorded in terms of mV or dBmV. Appropriate corrections must be made to the receiver readings based on the termination network used for common-mode measurements. This is due to the voltage divider circuit of the termination network (see Figure 3). The common-mode voltage is the total voltage drop across the two 67.5 Ω resistors in parallel, in series with the 56.3 Ω resistor to ground.
5.7.4 Performance degradation Degradation criterion should be established using the guidelines described in Annex A.
5.7.5 Test equipment The test equipment required to perform this test is as follows: a)
EMI receiver (as specified in ANSI C63.2) A frequency selective meter should be used for the measurements. The frequency selective meter may consist of a receiver, spectrum analyzer, or frequency selective voltmeter. For differential-mode measurements, the meter must have a balanced input unless a balance-to-unbalance (balun) transformer termination network is used [see item b)]. The frequency response of the meter should be flat (± 3 dB) for 10 kHz to 30 MHz.
b)
Balun network 1)
Frequency range: 10 kHz to 30 MHz
2)
Balance side: 135 Ω
3)
Unbalance side: 50 Ω
c)
Two 5 µF capacitors, which should be matched to preserve the balance of the circuit. Capacitors should not become inductive below 30 MHz. Good results have been obtained from polypropylene capacitors.
d)
Telephone termination network, Z M = 135 Ω (100 Ω above 6 MHz), Z L = 90 Ω
Figure 3 shows a schematic diagram of the termination network. This termination network terminates the EUT in differential-mode and common-mode impedances simultaneously. The common-mode conversion loss of the termination network should be greater than 60 dB in the frequency range from 10 kHz to 1 MHz, and greater than 40 dB in the frequency range from 1 MHz to 30 MHz. Figure 4 is an example of the balun termination network. This type of termination network allows the use of unbalanced frequency-selective meters.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
Figure 3 —Termination network
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
Figure 4 —Balun termination (metallic and longitudinal)
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
Figure 5 —Test circuit
Figure 6 —Injection circuit (differential mode only)
16
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
Tip 5 F
67.5
Balun 135:50
5 F
96
~
Unbalance capacitor
Reference Point
Ring Figure 7 —Injection circuit (common mode/differential mode)
5.8 CI-8: Telecommunications telephone terminal equipment, immunity requirements for equipment having an acoustic output, 150 kHz to 30 MHz 5.8.1 General considerations The purpose of this test is to determine the immunity of telephone terminal equipment (TTE) to RF signals. For this subclause the term “TTE” applies only to an electronic device that has a wire line connection to the public telecommunications network. In addition, the compliance criteria related to an acoustic output is only specified for the acoustic output from a handset receiver.
5.8.2 Measurement procedure Use the measurement procedure given in ANSI/TIA/EIA-631.
5.8.3 Immunity signal The test signal should be swept from 150 kHz to 30 MHz and be 80 % amplitude modulated by a 1 kHz sinusoidal wave. The amplitude of the un-modulated conducted signal shall be 3 V rms.
5.8.4 Compliance criteria
5.8.4.1 Receive (near-end interference) The demodulated acoustic output from the handset receiver of the TTE shall not exceed 55 dBSPL, except in the frequency band from 500 kHz to 2 MHz, where the demodulated acoustic output shall not exceed 45 dBSPL, measured at 1 kHz in all off-hook operating states that affect compliance. If the TTE is equipped with receive volume control, the control shall be set to produce the nominal Receive Objective 17 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
Loudness Rating (ROLR) specified in ANSI/TIA-470A for analog TTE and ANSI/TIA-579 for digital TTE.
5.8.4.2 Transmit (far-end interference) For analog equipment, the demodulated signal output measured on-hook and off-hook at the artificial central office (CO) termination shall not exceed –55 dBV (1.77 mV), except in the frequency band from 500 kHz to 2 MHz, where the demodulated signal output shall not exceed –65 dBV (0.56 mV), when measured at 1 kHz for all operating states that affect compliance. For digital equipment, the EUT is connected to a compatible digital telephone. The demodulated acoustic output from the handset receiver of the compatible telephone shall comply with the receive criteria above.
6. Radiated immunity
6.1 RI-1: Uniform magnetic field immunity, Helmholtz coil, 30 Hz to 100 kHz The purpose of this test is to determine if the EUT is immune to magnetic fields over the frequency range of 30 Hz to 100 kHz with a magnetic field strength of 140 dBpT (10 µT).
6.1.1 Measurement procedure The measurement procedure shall be as given in 5.18.4 through 5.18.4.4 of MIL-STD 461E Method RS101.
6.1.2 Description of the Helmholtz coil The Helmholtz coil consists of two identical coils spaced a distance of one coil radius apart. Using the test equipment specified, the magnetic field strength produced by a known current through the coils can be determined by Equation (1): H =
0.7155 NI R
(1)
where H = the magnetic field in amperes per meter (A/m) N = the number of turns per coil I = the coil current in amperes R = the coil radius in meters NOTE 1— B = H in air, i.e., B(dBpT) = H (dBµA/m) + 2 dB(pT = picotesla = 10 –12 Tesla = 10 –6 µT).
Vary the output level of the function generator as indicated in the appropriate specification, within the limitations of the power amplifier. The coils are connected series aiding. Use H = 7.96 A/m (140 dBpT) unless required to be otherwise by the equipment specifications. NOTE 2—The 7.96 A/m value represents a practical maximum field strength that can be produced by a reasonably sized amplifier and a Helmholtz coil.
For EUTs with dimensions less than one coil radius, use a standard Helmholtz configuration (coils separated by one coil radius). For EUTs with dimensions greater than one coil radius, use the optional configuration. Select a coil separation such that the plane of the EUT face is at least 5 cm from the plane of the coils and such that the separation between the coils does not exceed 1.5 times the radii.
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6.2 RI-2: Magnetic field immunity, point source, 30 Hz to 100 kHz The purpose of this test is to determine if the EUT is immune to small-area magnetic fields over the frequency range of 30 Hz to 100 kHz.
6.2.1 Measurement procedure Use the measurement procedure given in Method RS 101 of MIL-STD-461E.
6.2.2 Suggested immunity level The suggested immunity level shall be as shown in Figure RS 101-2 of MIL-STD-461E, 180 dBpT (1000 µT) from 30 Hz to 60 Hz, then decreasing to 116 dB pT (0.6 µT) at 100 kHz.
6.2.3 Correction factor To convert measurement receiver readings expressed in decibels above one microvolt (dBµV) to decibels above one picotesla (dBpT), add the factor shown in Figure 8.
Figure 8 —Correction factor from dBµV (add to meter reading) to dBpT for a meter with 50 Ω input impedance
6.3 RI-3: Power frequency magnetic induction field The purpose of this test is to determine if the EUT signal lines are immune to power frequency inductive fields. This method is derived from MIL-STD-462.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
6.3.1 Measurement procedure and test setup Set up the test equipment as shown in Figure 9. The EUT cables to the support equipment should be representative of the actual installation. Care should be taken to isolate the support equipment from upset or to adequately discern support equipment upset from EUT upset. With the equipment connected as shown, tune the function generator to the EUT power frequency. Using the ac monitoring device connected across the shunt resistor, calculate the ac power frequency current being applied to the test wire. Adjust the function generator output until the desired ac power frequency current is reached. Monitor the EUT for evidence of malfunction or degradation of performance during testing. If malfunction or degradation of performance is observed from the EUT, lower the level of the immunity field until a threshold immunity level is obtained. Document the frequency and current level of the EUT immunity threshold.
6.3.2 Immunity signal Using the test equipment specified, 20 A of current can be applied to the test wire at the EUT power frequency for this test method.
6.3.3 Performance degradation Degradation criterion should be established using the guidelines described in Annex A.
6.3.4 Required test equipment The test equipment required to perform this test is as follows: a)
b)
c)
d)
e)
Insulated test wire 1)
Gauge: No. 14 AWG
2)
Length: dependent on test sample size
Audio isolation transformer (two required) 1)
Primary impedance: 5 Ω or less
2)
Secondary impedance: 1/4 of the primary impedance
3)
Frequency response: 30 Hz to 1 kHz
4)
Audio power rating: 100 W
5)
Secondary saturation: 50 A ac or dc maximum
6)
Turns ratio: two-to-one step down with an additional identical secondary winding for connection of a voltmeter
7)
Size: 11.4 cm × 13.3 cm × 15.9 cm (4.5 in × 5.25 in × 6.25 in)
Function generator or audio oscillator (waveforms: sine, triangular, or square, as required) 1)
Frequency range: 30 Hz to 1 kHz
2)
Frequency accuracy: ± 3 %
3)
Output: 0 V to 3 V
Audio amplifier 1)
Frequency range: 30 Hz to 1 kHz
2)
Power output: 100 W
3)
Output impedance: 2 Ω
AC voltmeter 20 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
1)
Input impedance: 100 k Ω or greater
2)
Frequency range: 30 Hz to 1 kHz
3)
Voltage range: 0.001 V to 5 V
f) Non-inductive resistor, 0.1 Ω 1)
Resistance: 0.1 Ω
2)
Tolerance: 1 %
3)
Power handling: 100 W 2:1 Transformer
I=20A
AC voltmeter
Audio oscillator or function generator
Audio amplifier
R1=2.5 Non-inductive Shunt
40 cm
40 cm
Support Equipment
EUT
NOTE—Wire is run on and parallel to interconnecting leads. Tape to EUT cable for 2 m in length, or the actual cable length, whichever is less. Maintain a minimum 40 cm separation from termination at either end of the cable.
Figure 9 —Test setup for power frequency induction
6.4 RI-4: Spikes-inductive field immunity The purpose of this test is to determine if the EUT signal lines are immune to spike-inductive fields. This method is derived from MIL-STD-462. An alternative method can be found in MIL-STD-461E, CS-115.
6.4.1 Measurement procedure and test setup For the spike immunity test, set up the equipment as shown in Figure 10. The EUT cables to the support equipment should be representative of the actual installation. Care should be taken to isolate the support equipment from upset or to adequately discern support equipment upset from EUT upset. With the equipment connected as shown measure the spike voltage using the oscilloscope. Adjust the spike generator output until the desired spike voltage is reached. Monitor the EUT for evidence of malfunction or degradation of performance during testing. If malfunction or degradation of performance is observed from the EUT, lower the level of the field until a threshold immunity level is obtained.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
6.4.2 Immunity signal A 200 V, 10 ms transient is applied to the test wire using the test equipment specified in 6.4.4. This level shall be measured and calibrated across a 5 Ω resistor.
6.4.3 Performance degradation Degradation criterion should be established using the guidelines described in Annex A.
6.4.4 Test equipment The test equipment required to perform this test is as follows: a)
b)
Insulated test wire 1)
Gauge: No. 14 AWG
2)
Length: dependent on test sample size
Spike generator 1)
Pulse width: 10 ms
2)
Pulse repetition rate: 1 pulse/s to 500 pulses/s PRF (Pulse Repetition Frequency)
3)
Voltage output: 0 V to 200 V peak
4)
Output impedance: 0.5 Ω
5)
Pulse decay time: 10 ms
6)
Rise time: less than 1 ms
c) Non-inductive resistor
d)
1)
Resistance: 5 Ω
2)
Tolerance: 5 %
3)
Power: 10 W
Storage oscilloscope with 10x probe 1)
Bandwidth: 10 MHz or greater
2)
Voltage range: 20 mV to 10 V
3)
Impedance: 100 k Ω or greater
NOTE—The 5 Ω resistor is used only during calibration and short-circuited during the test.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
10x Probe
5
Spike Generator
non-inductive load (only used during calibration)
Oscilloscope
40 cm
Support Equipment
EUT
NOTE—Wire is run on and parallel to interconnecting leads. Tape to EUT cable for 2 m in length, or the actual cable length, whichever is less. Maintain a minimum 40 cm separation from termination at either end of the cable.
Figure 10—Test setup for spike induction field
6.5 RI-5: Electric field immunity in a TEM cell, 10 kHz to 80 MHz This test is derived from an earlier version of NBS TN 1013. This test may also be performed by the method RI-6 if the field can be reliably established. The purpose of this test is to determine immunity of equipment (whose largest dimension is less than 50 cm) to radiated fields over the frequency range of 10 kHz to 80 MHz by using a transverse electromagnetic (TEM) cell (TEM mode).
6.5.1 Measurement procedure See Annex B for a discussion of the TEM cell set-up and procedure.
6.5.2 Immunity signal The EUT should be exposed to the vertically polarized electric field generated in the TEM cell at levels up to the maximum test field specified by the testing requirement or until EUT performance degradation occurs. The EUT should be rotated to expose each orthogonal axis to the electric field.
6.6 RI-6: Electric field immunity, 80 MHz to 10 GHz The purpose of this test is to determine if the EUT is immune to radiated electric fields over the frequency range of 80 MHz to 10 GHz.
6.6.1 Measurement procedure Use the measurement procedure given in IEC 61000-4-3.
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6.6.2 Suggested immunity level The suggested level for residential, commercial or light industrial environments is 3 V/m. The suggested level for industrial environments is 10 V/m. Light industrial environments are defined as those locations that are characterized by being supplied directly at low voltage from the public mains network. Industrial environments are characterized by the existence of one or more of the following: a)
Power network exists powered by a high or medium voltage power transformer dedicated to supply of an installation feeding manufacturing or similar plant.
b)
Industrial, scientific or medical (ISM) apparatus.
c)
Heavy inductive or capacitive loads are frequently switched.
d)
Currents and associated magnetic field strengths are high.
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Annex A (informative)
Immunity testing tutorial
A.1 Basic issues The basic problems in establishing a universal measurement technique for immunity testing can be summarized as follows: a)
Establishing a known test (immunity) field or signal that adequately simulates (or represents) a real world EM environment at locations where electronic equipment operates.
b)
Repeating the identical immunity field or signal in successive test runs at different locations/test facilities for different EUTs and for different configuration and operational environments.
c)
Exposing the EUT and its associated leads over the entire volume in a test facility using efficient and cost effective methods that do not interfere with other processes or experiments.
d)
Monitoring performance degradation/failure without disturbing the applied immunity field incident on the EUT, and setting adequate degradation thresholds.
e)
Maintaining a current, technologically-sound test facility without obsolescing existing chambers and instrumentation.
.
A.2 Immunity environment A good knowledge of the EM environment, present and future, would be ideal to have. However, these environments near broad categories of electronic equipment are not well known. General RF environmental studies that have been made include those by the U.S. Environmental Protection Agency (EPA) and Canadian Department of Communications. The results of those studies provide useful estimates for broadcast services. Past experiences with specific product immunity cannot be relied upon since the EM environment is changing rapidly and the products are being updated with more sensitive electronics. Hence, setting immunity criteria may come down to recognizing that a product will at some time in its use experience a minimum EM field. Various studies have shown that electronics equipment will be exposed to 1 V/m or less for 95% of the time. It is further indicated that this level is broadband and applies for all frequencies above 10 kHz. This type of immunity level could well be stipulated for the “Noticeable Degradation” susceptibility criteria. Of course, the appropriate type of modulation or pulse repetition rate of keying, for example, would have to be stipulated. These additional requirements would be made based on engineering an immunity test that would provide an electromagnetic disturbance signal that is most likely to duplicate the types of interference that will be encountered. It should be noted that merely representing the licensed radio service might not be totally indicative of the effect that the RF environment has on susceptible products. For example, where audio rectification effects in linear circuits are of concern, it is not advisable to simulate only the FM modulation associated with certain broadcast environments. Field experience has shown that it is the residual AM modulation due to multi-path propagation in these environments that is primarily responsible for audible interference. Levels of 6% or more amplitude modulation are typical within steel-framed buildings.
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A.3 Immunity trade-offs Consumer electronic products are competitively priced, with a high expectation of safety, performance, reliability, ease of operation, and a number of other attributes that the public considers important. The market demonstrates that by and large these expectations are being met. Electronics are being added to replace functions that where previously mechanical or electromechanical, and/or providing functionality that did not previously exist; however, it has resulted in products significantly more susceptible to the EM environment. The plethora of products having high saturation in U.S. households together with people living closer together has complicated the problem. The Citizens Band Radio (CB) explosion of the past awakened the consumer electronics industry to the necessity of improving their designs to meet a hostile EM environment. There are mixed signals of success. EMI immunity is complicated and not achieved by simple or easy solutions. “Good engineering practice” now denotes sophistication commensurate with that of the product itself. Economics dictates against shotgun approaches such as shielding the product within a metal box, although the technique may apply to certain circuits. The manufacturer faces the EMI immunity trade-off of pricing its product out of the market or failing to meet the expectations of most of its customers. Each manufacturer, by intent or accident, establishes some level of EMI immunity, which is determined by a number of factors. Significant factors include the following: a) Type of product (audio, video, radio, television, digital) b)
Product environment (home, auto, etc.)
c)
Designated market (or country where the design specifications are set)
d)
Awareness of problems (access to and action on field service information)
e)
Product cost (absolute and relative to similar products)
f)
Depth of engineering
A.4 Present day radiated immunity test facilities Key to the five basic measurement problems for radiated E-field immunity is the adequacy and limitations of present day test facilities, which are summarized in the subclauses that follow.
A.4.1 Open-area test sites All other parameters considered, ideally one would want to measure radiated equipment immunity knowing that no other object would affect the results. Indeed, the interactions among the EUT, antenna used to reproduce the desired field, and surrounding conducting/reflecting objects are minimized in an open field. In addition, there is no EUT size limitation. Theoretically with the right antenna(s), full spectrum testing is possible. However, there are disadvantages, such as the following: a)
The ambient EM environment may affect the test results.
b)
Generating an immunity test field may affect other radio frequency services and in fact may be disallowed by regulatory agencies. 12
c)
This approach is limited to discrete frequencies and requires an experimental license to radiate the test field.
12
For example, an FCC Public Notice dated July 3, 1996 describes conditions about use of outdoor test sites for RF immunity testing; (http://www.fcc.gov/oet/ea/eameasurements.html); (http://www.fcc.gov/Bureaus/Miscellaneous/Public_Notices/1996/pnmc6033.txt).
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d)
Real estate may not be available or may not have sufficiently uniform ground conductivity to permit repeatable tests. This is true especially during extremes in weather unless special construction is applied to provide a uniform ground, e.g., a conducting metal ground plane, an all-weather capability.
e)
The facility should be physically a part of the engineering design environment for quick access.
f)
Limitations exist for generating sufficiently high-level susceptibility test fields over the required volumes because of antenna efficiency and cost of high-power amplifiers. This often leads to performing the tests in the near field where field components are large but with arbitrary polarization and large field gradients.
Manufacturers routinely use quasi-open-field testing on a qualitative basis when they take new models to locations that pose difficult interference problems. This is an acceptable method of evaluating interference susceptibility in the absence of a regulatory limit, since the source(s) are already part of the general RF ambient.
A.4.2 Shielded enclosures To reduce the EM background noise when making low-level emission tests and to contain immunity test fields, shielded enclosures with no absorbing material on the walls and ceiling are not generally used anymore. Studies have shown that there are significant differences in measurements made in various shielded rooms using the same test setup. Results indicate that repeatability is sometimes difficult to achieve from day-today and among various test personnel performing the same test in the same room. Reported errors up to +40 dB when compared to similar open field test setups at frequencies above 20 MHz have been found due to room resonances and standing waves. The interaction among immunity test fields launched by antenna, room walls, and the EUT also cause errors of varying magnitudes. In addition, the immunity fields generally require costly, high-power amplifiers because of the antenna efficiency and the location of standing wave nulls. Below about 50 MHz, the EUT is exposed to the near field of the generated signal components with field strength much higher than desired and with arbitrary polarization. The inherent problems of testing in untreated shielded rooms have led to a proliferation of new immunity test methods that yield less error than those that occur when testing in shielded rooms. The following subclauses analyze a few of these new techniques that have been successfully used in assessing the immunity of electronic devices over certain frequency ranges.
A.4.3 Anechoic shielded rooms Anechoic shielded rooms can be ferrite lines, absorber lined, or hybrid (both ferrite and absorber). The usable frequency range of these chambers will depend upon the size of the chamber and the absorber, tiles or both deployed in the design. In general, these sites are evaluated against an ideal open area test site for emissions testing and ideal uniformity requirements for immunity testing.
A.4.4 Transverse electromagnetic cells One test facility that is usable at frequencies down to virtually dc is called a TEM cell. TEM cells that are absorber loaded to obtain uniform fields over larger areas than standard TEM cells are usable to the GHz range. TEM cells have been extensively evaluated and are used by several consumer electronics manufacturers, including the automotive industry. Like the shielded room, immunity test fields are contained within the cell structure. For TEM cells that have tapers on both ends, repeatable test fields can be generated up to a frequency at which the cell multi-modes and becomes a resonant cavity. A 2 m absorber-lined cell, suitable for measuring large TV receivers, has been demonstrated to be effective to 220 MHz. The frequency at which the cell multi-modes is inversely proportional to the size of the cell and hence the size of the EUT that can be tested. Commercial TEM cells can readily provide circuit board testing up to 1 GHz or higher. The TEM cell has another advantage of being reciprocal so that, within 27 Copyright © 2010 IEEE. All rights reserved.
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certain limitations, it can be used to measure radiated emissions from the EUT. Its efficiency in this mode allows low-level radiation in the microwatt region to be measured. The prime disadvantage is that a tradeoff is required between EUT test volume and cell bandwidth, i.e., the larger the EUT test volume, the lower the maximum test frequency. Also the EUT dimensions should not exceed 1/3 the interior cell dimensions.
A.4.5 Mode-stirred reverberation chambers Another facility for testing equipment immunity is called a mode-stirred reverberation chamber. The EUT is exposed on all faces to power that changes as a paddle wheel inside the test chamber is either rotated or positioned (stepped). The paddle wheel distributes the energy in much the same way as a microwave oven stirrer. The distribution of power illuminating the EUT is independent of EUT orientation or location, assuming the EUT is placed at least 0.5 m away from the nearest wall within the test chamber. Note that the test chamber can be a standard shielded enclosure with all lossy material such as the false floor removed to improve the chamber’s quality factor (Q). Immunity is determined in terms of an equivalent plane wave power density, or equivalent average field strength that may require some change of immunity limits. The correlation between electronics degradation caused by a launched electric field in free space and a test field launched in a reverberation chamber is related to the directivity or free space gain characteristics of the EUT. The factor by which the reverberation chamber indicates the EUT is more immune than the free space technique is in proportion to the EUT free space gain.
A.4.6 Fully anechoic rooms (FARs) Another test facility gaining some prominence is a shielded room that replicates “free space” conditions by placing RF absorbing material on all six surfaces of the shielded room. The advantage is that for immunity testing the field applied to the volume occupied by the EUT is not perturbed by any undesired reflected signals from the walls, ceiling, or floor. Hence the applied immunity signal launched at the EUT is well controlled. A possible disadvantage, especially for floor-standing EUTs, is that any RF reference these EUTs would have to a ground plane is in fact not possible as the EUT is on top of the floor absorbing material in these rooms.
A.4.7 Summary of radiated immunity test facilities A universal method for assessing electronic product RF radiated immunity is not available to meet everyone’s needs. The size and extent of the electronics dictates the use of some test facilities for system testing, while the need for accuracy of the applied field dictates the use of others. Hence, a composite of several test facilities, each used where it is most accurate and meaningful, may be necessary to fully characterize the immunity of the EUT.
A.5 Immunity compliance criteria A.5.1 General Before immunity of an EUT can be evaluated, an immunity compliance criterion must be established. This is usually expressed in terms of the performance degradation allowed during an immunity test, which can be specified by a standard or by an agreement between purchaser and manufacturer. Product standards often specify product-specific immunity compliance criteria. Several classifications of degrees of performance degradation are as follows: a) No degradation: Equipment complies with its design specifications. This type of criteria should be adopted for sensitive health and safety equipment, as well as services with impact on large populations of consumers. It might conceivably be required for some critical processes or equipment operation as well.
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b) Noticeable degradation: In this case, the EM environment has affected the performance. For example, the degradation can cause increased noise in video and audio circuits, decreased signal-to-noise in control circuits, error rates approaching an allowable system maximum, or annoying audio or visual interference. While not debilitating, electromagnetic disturbance levels just below or at this level might be used to specify the mass-produced consumer electronics immunity level. No operator intervention should be required to continue use of the electronic product/equipment. c)
Serious degradation: Operator intervention is required to restore specific operation of electronic product/equipment. Examples may be system lockups, resets, indiscriminate writing on floppy disks, and other altering of data memory. In this category, the electronics equipment will not be able to provide continuous satisfactory operation, and it is almost certain to create situations where customer complaints are common. To correct this, field engineering or customer service representatives will spend considerable time in the field trying to identify and correct the problem. Customer pressure will be felt probably at the local level. This immunity level should be set such that this occurs on very rare occasions.
d) Failure/total inoperability: This is the most serious category, where the electronic product totally fails and cannot be reset to regain operability. Eventually, mechanical damage could occur. This situation is obviously totally unsatisfactory. No field repair can be accomplished. This creates a need for complete equipment replacement with a crash design job to increase its EMI immunity. Customer service could be interrupted for an indefinite time, dependent on the capability of the manufacturer to produce a satisfactory replacement product. Customer complaints would probably reach all levels of management and even public media.
A.5.2 Survey of specific degradation criteria A.5.1 presented examples of the classifications of performance degradation. This subclause presents specifications and classification of performance degradation from other standards.
A.5.2.1 MIL-STD-461E MIL-STD-461E requires that “the threshold of susceptibility” be determined. Subclause 4.3.10.4.3 of MIL-STD-461E specifies the following: When susceptibility is detected, reduce the interference signal until the EUT recovers. Reduce the interference level by an additional 6 dB. Gradually increase the interference signal until the susceptibility condition reoccurs. The resulting level is the threshold of susceptibility. Record this level, frequency range of occurrence, frequency and level of greatest susceptibility, and other test parameters, as applicable.
A.5.2.2 MDS-201-0004 The FDA document MDS-201-0004 at subclause 5.4 gives two definitions that can provide guidance in setting degradation criteria. They are as follows: a) Insignificant Malfunction —Any manifestation of inoperability or degradation of performance that does not adversely affect the safety of the device and does not diminish the effectiveness in its intended use; and b)
Susceptibility Degradation Criteria —A delineation of the essential safety and performance characteristics of a medical device and the allowed degradation of those characteristics during susceptibility testing.
A.5.2.3 RTCA DO-160E The RTCA Inc. (http://www.rtca.org/) document requires three levels of severity of test depending upon the use of the equipment and that the equipment exhibits no noticeable degradation at the specified stress level. 29 Copyright © 2010 IEEE. All rights reserved.
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A.5.2.4 Degradation for analog and digital home entertainment equipment The EIA has identified several types of performance degradation to home entertainment products. They are indicated in the subclauses that follow.
A.5.2.4.1 Analog signals (noticeable degradation) Criteria can be established for defining satisfactory performance of a transmission channel or equipment in the presence of impairments; however, they will result in a statistical definition as the perception of the impairments varies considerably from one individual to the next. Use of “just perceptible interference” provides repeatable measurements, because results are not significantly biased by the observer/auditor. Use of “just perceptible interference” is therefore preferred. Examples of statistical definitions of acceptable or satisfactory performance in the presence of impairments follow for use as circumstances dictate. a)
Television (Noticeable and Just Perceptible Degradation) is the ratio of desired/undesired signals for “just perceptible interference” varies from about 0 dB to 57 dB, depending on the nature of the impairment.
b) Audio (Noticeable Degradation) is the ratio for “just perceptible interference” varies from about 20 dB (correlated stereo) to 60 dB, depending on the nature of the impairment.
A.5.2.4.2 Digital signals The effect of impairments on digital signals or transmissions must of necessity be defined statistically. Data Channel (Noticeable Degradation) is a bit error rate (BER) of 10 –3 is considered representative of the limit acceptable service for broadcast teletext. However, under a number of impairment conditions BER values may be inconsistent with system performance. The resulting readings become sufficiently unstable and unrepeatable as to make the test outcome questionable.
A.5.3 Degradation for automotive electronics The International Standards Organization (ISO) Technical Committee (TC) 22, Subcommittee 3, Wor king Group 3 has written a classification scheme of failure mode severity for future inclusion in ISO 7637-1. 13
A.5.4 Classification of functional status The following are the four classes identified: a)
Status I: The function performs as designed during and after the test.
b)
Status II: The function does not perform as designed during the test but returns automatically to normal operation after the test.
c)
Status III: The function does not perform as designed during the test and does not return to normal operation without a simple driver/passenger intervention such as turning off/on the DUT or cycling the ignition switch after the d isturbance is removed.
d)
Status IV: The function does not perform as designed during and after the test and cannot be returned to proper operation without more extensive intervention such as disconnecting and reconnecting the battery or power feed. The function shall not have sustained any permanent damage as a result of the testing.
13
ISO 7637-1:2002, Road vehicles — Electrical disturbances from conduction and coupling — Part 1: Definitions and general considerations.
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A.6 Other performance degradation concepts In some cases, the description of performance degradation recording is incomplete. For these cases, a general technique is to record the frequencies and field levels at which degradation is observed at or below a specified tolerance or limit. Some examples of general degradation may be as follows: a)
Greater than 10 % change in an analog voltage output.
b)
Change in state of digital output.
c)
Error rate greater than 1 bit in a data stream.
d)
Greater than 6 dB change in aural output.
Any deviation criterion other than described above may be used provided the criterion is clearly stated. For example, the criterion might be that the EUT meets performance/data sheet specifications within manufacturing tolerance.
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Annex B (informative)
Recommended test equipment for measurement methods where measurement procedure is in a referenced document
B.1 Test equipment recommended for method CI-1: power-line immunity a)
b)
c)
d)
Audio isolation transformer (two required) 1)
Primary impedance: 5 Ω or less
2)
Secondary impedance: 1/4 of the primary impedance (1.25 Ω or less)
3)
Frequency response: 30 Hz to 150 kHz
4)
Audio power rating: 100 W
5)
Secondary saturation: 50 A ac or dc maximum
6)
Turns ratio: two-to-one step down with an additional identical secondary winding for connection of a voltmeter
Function generator (waveforms: sine, triangular square, as required) 1)
Primary impedance: 5 Ω or less
2)
Frequency accuracy: ± 3 %
3)
Output: 0 V to 10 V (or sufficient to develop test voltage)
Audio amplifier 1)
Frequency range: 30 Hz to 150 kHz
2)
Power rating: 100 Ω
3)
Output impedance: 2 Ω
EMI receiver (or spectrum analyzer) 1)
Frequency range: 30 Hz to 150 kHz
2)
Input impedance: 50 Ω
3)
Amplitude accuracy: ± 1.5 dB
4)
Bandwidth: sufficiently narrow to track injected signal
5)
Voltage range: 0.1 V to 1 V
B.2 Test equipment recommended for method CI-2: power-line and s ignal-line immunity, bulk current injection a)
Measurement receivers
b)
Current injection probes
c)
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d)
Calibration fixture: coaxial transmission line with 50 Ω characteristic impedance, coaxial connections on both ends, and space for an injection probe around the center conductor
e)
Directional coupler
f)
Signal generator
g)
Plotter
h)
Attenuators, 50 Ω
i)
Coaxial loads, 50 Ω
j)
Power amplifiers
k)
LISNs
B.3 Test equipment recommended for CI-4: receiver antenna input immunity for TVs and VCRs Use the equipment recommended in ANSI/EIA 544 and/or CEA-31.
B.4 Test equipment recommended for method CI-5: power-line surge voltage test (IEC 61000-4-5) Combination wave generator—open circuit/short-circuit specifications a)
b)
Open-circuit output voltage: 500 V to at least 4 kV 1)
Waveform parameters—front time: 1.2 ms
2)
Waveform parameters—time to half value: 50 ms
3)
Tolerance of open-circuit output voltage: ± 10 %
Short-circuit output current: 250 A to at least 2 kA 1)
Waveform parameters—front time: 8 ms
2)
Waveform parameters—time to half value: 20 ms
3)
Tolerance of short-circuit output current: ± 10 %
c)
Polarity: positive and negative
d)
Phase shifting: 0 degrees to 360 degrees
e)
Repetition rate: at least one per minute
f)
Coupling/decoupling networks (CDNs)—see IEC 61000-4-5 for details
B.5 Test equipment recommended for method CI-6: electrical fast transient test (IEC 61000-4-4) The characteristics of the fast transient/burst generator are the following: a)
Output voltage range with 1000 Ω load shall be at least 0.25 kV to 4 kV
b)
Output voltage range with 50 Ω load shall be at least 0.125 kV to 2 kV. The generator shall be capable of operating under short-circuit conditions.
c)
Polarity: positive/negative
d)
Output type: coaxial, 50 Ω
e)
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f)
Repetition frequency: (see Table 2) ± 20 %
g)
Relation to power supply: asynchronous
h)
Burst duration: 15 ms ± 20 % at 5 kHz, 0.75 ms ± 20 % at 100 kHz
i)
Burst period: 300 ms ± 20 %
j)
Wave shape of the pulse 1)
2)
3)
Into a 50 Ω load i)
Rise time t r = 5 ns ± 30 %
ii)
Duration t d (to 50 %) = 50 ns ± 30 %
iii)
Peak voltage = according to Table B.1, ± 10 %
Into a 1000 Ω load i)
Rise time t r = 5 ns ± 30 %
ii)
Duration t d (to 50 %) = 50 ns with a tolerance of –15 ns to +100 ns
iii)
Peak voltage = according to Table B.1, ± 20 %
Coupling/decoupling networks (CDNs)—See IEC 61000-4-4 for details.
Table B.1—EFT peak voltages Set voltage kV
V p (open
V p (1000 Ω)
V p (50 Ω)
circuit) kV
kV
kV
Repetition frequency kHz
0.25 0.5 1 2 4
0.25 0.5 1 2 4
0.24 0.48 0.95 1.9 3.8
0.125 0.25 0.5 1 2
5 or 100 5 or 100 5 or 100 5 or 100 5 or 100
B.6 Test equipment recommended for method CI-8: telecommunications equipment with an acoustic output, 150 kHz to 30 MHz a)
b)
Signal source (including amplifier) 1)
Frequency range: 150 kHz to 30 MHz
2)
Frequency accuracy: 1 %
3)
Output voltage range: 0 V to 10 V
4)
Harmonic and spurious signal: greater than 30 dB down
5)
Modulation characteristics: AM, CW
LISN 1)
T-LISN per IEC specifications
2)
LISN per FCC/ANSI specifications
c)
Preamplifier
d)
Selective voltmeter
e)
Artificial ear or acoustic tube
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B.7 Test equipment recommended for method RI-1: magnetic field immunity, Helmholtz coil a)
b)
c)
Helmholtz coil 1)
Diameter: 2.9 times the longest dimension of EUT or greater (or as determined from Bronaugh 1990)14
2)
Coil spacing: equal to radius
3)
Self-resonance: greater than 100 kHz
Function generator (waveforms: sine, triangular, or square, as required) 1)
Frequency range: 30 Hz to 100 kHz
2)
Frequency accuracy: ± 3 %
3)
Output: 0 V to 3 V
Audio amplifier 1)
Frequency range: 30 Hz to 100 kHz
2)
Power output: 100 W
3)
Output impedance: 2
d) Non-inductive resistor
e)
f)
g)
1)
Resistance: 1
2)
Tolerance: 1 %
3)
Power handling: 100 W
AC voltmeter 1)
Input impedance: 100 k Ω or greater
2)
Frequency range: 20 Hz to 100 kHz
3)
Voltage range: 0.001 V to 5 V
Current probe 1)
Frequency range: 30 Hz to 100 kHz
2)
Current range: 0 A to greater than 10 A
3)
Transfer impedance: 0.33
4)
Sensitivity under rated load: 0.33 mA with a 1 mV sensitivity receiver and 0.33 Ω transfer impedance
5)
Window size (center opening): 3.2 cm (1.25 in) diameter
EMI Receiver (or spectrum analyzer) 1)
Frequency range: 30 Hz to 100 kHz
2)
Input impedance: 50
3)
Amplitude accuracy: ± 1.5 dB
4)
Bandwidth: 5 Hz to 5 kHz and 30 Hz to 100 kHz
14
E. L. Bronaugh, “Helmholtz coils for EMI immunity testing: stretching the uniform field area,” IEE Seventh International Conference on Electromagnetic Compatibility, York, UK, pp. 169-172, 1990.
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5) h)
Voltage range: 0.1 mV to 1 V
Magnetic field probe 1)
Diameter: 13.3 cm
2) Number of turns: 36 3)
Wire: 9 strands of 41 AWG wire (0.11 mm diameter)
4)
Shielding: electro-statically shielded
5)
Transfer impedance: to be calibrated (from volts across 50 Ω to dBpT)
B.8 Test equipment recommended for method RI-2: magnetic field immunity, point source a)
b)
Function generator or audio oscillator (waveforms: sine, triangular, or square, as required) 1)
Frequency range: 30 Hz to 30 kHz
2)
Frequency accuracy: ± 3 %
3)
Output: 0 V to 3 V
Audio amplifier 1)
Frequency range: 30 Hz to 30 kHz
2)
Power output: 100 W
3)
Output impedance: 2 Ω
c) Non-inductive resistor (used as current shunt)
d)
1)
Resistance: 1 Ω
2)
Tolerance: 1 %
3)
Power handling: 100 W
AC voltmeter 1)
Input impedance: 100 k Ω or greater
2)
Frequency range: 20 Hz to 30 kHz
3)
Voltage range: 0.001 V to 5 V
e)
Magnetic radiating loop (as shown in MIL-STD-461E)
f)
Current probe
g)
1)
Frequency range: 30 Hz to 30 kHz
2)
Current range: 0 A to greater than 10 A
3)
Transfer impedance: 0.33 Ω
4)
Sensitivity under rated load: 0.33 mA with a 0.1 mV sensitivity receiver and 0.33 Ω transfer impedance
5)
Window size (center opening): 3.2 cm (1.25 in) diameter
EMI Receiver 1)
Frequency range: 30 Hz to 30 kHz
2)
Input impedance: 50 Ω 36 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
h)
3)
Amplitude accuracy: ± 1.5 dB
4)
Bandwidth: 5 Hz to 5 kHz, 50 Hz to 30 kHz
5)
Voltage range: 0.1 mV to 10 V
Radiating loop 1)
Diameter: 12 cm
2) Number of turns: 10 to 20
i)
3)
Wire: No. 12 insulated copper
4)
Magnetic flux density per A of applied current: 9.5 × 10 –5 T at a distance of 5 cm from the plane of the loop
Loop sensor 1)
Diameter: 13.3 cm
2) Number of turns: 36 3)
Wire: 7-41 Litz (7 strand, No. 41 AWG)
B.9 Test equipment and other considerations recommended for method RI-5: electric field immunity, 10 kHz to 80 MHz (TEM cell method per NBS TN 1013) This test is derived from an earlier version of NBS TN 1013.
B.9.1 Test equipment a)
b)
c)
Signal source 1)
Frequency: 10 kHz to 80 MHz
2)
Frequency accuracy: ± 1 %
3)
Output voltage range: 0 V to 1 V
4)
Harmonic and spurious signal: more than 30 d B down from fundamental
5)
Modulation characteristics: FM CW, AM to 1 GHz, pulse above 200 MHz
TEM transmission cell 1)
Frequency range: 10 kHz to 80 MHz
2)
Septum (center conductor) width: 127 cm (54 in)
3)
Access door size: 72.6 cm × 45.72 cm (30 in × 18 in)
4)
Maximum test sample size: 58.42 cm × 58.42 cm × 20.32 cm (23 in × 23 in × 8 in)
5)
Maximum test sample weight: 91 kg (200 lb)
6)
TEM cell size inside dimensions: 360.6 cm × 185.42 cm × 129.54 cm (142 in × 73 in × 51 in). See NOTE 1 of B.9.2.
RF voltmeter with coaxial tee-junction connector 1)
Frequency range: 10 kHz to 80 MHz
2)
Voltage accuracy: ± 3 %
3)
Input impedance when used with coaxial tee-junction: 10 k Ω or greater
4)
VSWR of coaxial tee-junction: not to exceed 1.1:1, maximum 37 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
5) d)
e)
f)
g)
h)
Input impedance when used with 50 Ω adapter: 50 Ω
RF power amplifier 1)
Frequency range: 10 kHz to 80 MHz
2)
Power output: 100 W into 50
3)
Output impedance: 50 Ω
4)
Input impedance: 50 Ω
5)
Gain: greater than 40 dB
6)
Harmonic distortion: more than 25 dB below fundamental when operating at 80 % power rating
7)
Amplitude/output gain-flatness: ± 1.5 dB
Ω
Coaxial load 1)
Impedance: 50 Ω
2)
Power rating: 100 W
3)
VSWR: 1.1:1 maximum
Low-pass filter 1)
Cutoff frequency ( f c): as needed to suppress generator harmonics and spurious emissions up to 80 MHz
2)
Power rating: 100 W
3)
Impedance: 50 Ω
4)
Insertion loss in pass band: 0.3 dB maximum
5)
Pass-band VSWR: 1.25:1 maximum
6)
Attenuation: 60 dB at 1.5 f c
Dual-directional coupler 1)
Frequency range: 30 MHz to 80 MHz
2)
Power rating: 100 W
3)
Coupling factor: 50 dB ± 1 dB
4)
Directivity: 25 dB
5)
Insertion loss: 0.15 dB maximum
6)
Impedance: main line 50 Ω
7)
VSWR: 1.2:1 maximum
Power meter (two required) 1)
Range: 10 mW to 10 W
2)
Frequency range: 30 MHz to 80 MHz. For pulse signals, peak-reading power meters are required
B.9.2 Summary for TEM cell method The TEM cell method can be used to accurately generate absolute test fields when the EUT does not occupy an excessive portion of the test volume. It is especially useful for diagnostic testing, for example, to 38 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
determine frequencies of EUT susceptibility, to give some indication of how interference is coupled into the EUT, and to assess the relative improvement in the EUT immunity resulting from efforts to reduce EUT susceptibility. It cannot be used to determine EUT immunity to absolute test fields if the EUT includes long wire harnesses that must be exposed or polarization matched to the test field; only relative tests can be performed for this situation. NOTE 1—Detailed considerations concerning EUT size, frequency limitations, and construction specifications are given in NBS TN 1013. In general the EUT should be less than 1/3 the length ( L), width (2a), and separation distance between the cell septum (center conductor) and floor (b). Test samples of any size could be tested using a TEM cell modeled from the dimensions above as long as the EUT size versus the TEM cell size constraints prevent excessive impedance loading and test-field perturbation when inserting the EUT into the cell. Thus, a small EUT could be tested at higher frequencies in a smaller cell, and a large EUT could be tested at lower frequencies in a larger cell. The procedure for testing is the same for all sizes of cells except when using larger cells to obtain the same test field levels; then higher power signal sources and appropriate high-power terminations (50 Ω) are required. NOTE 2—The upper u seful frequency for a TEM cell is limited by the distortion of the test signal caused by multimodes and resonances that occur within the cell at frequencies above those listed for the test method and TEM cell example dimensions. The dimensions for cells suggested for use in the frequency range of 10 kHz through 80 MHz are given in item b) of B.9.1. The frequencies of resonances f resmn associated with these modes can be found from Equation (B.1):
2
f res
=
f c2
+
⎛ c ⎞ ⎜ ⎟ ⎝ 2l ⎠
(B.1)
where c = the wave propagation velocity (3.0 × 108 m/s) l = the resonant length of the cell
NOTE 3—The length of the cell fo r calculating the resonance of a particular mode is a function of how that mode is launched inside the cell. Some modes will exhibit waveguide below cut-off characteristics in the cell’s tapered transitions and hence are attenuated rapidly in the transitions while other modes, particularly those associated with the gap between the septum and sidewall, can propagate the full length of the cell. Thus, the recommended upper frequencies exceed the multimode cutoff frequency of the first higher order mode (TE01) but are less than this mode’s resonant frequency. NOTE 4—The useful upper frequency for the cell is reduced 10 % to 20 % from the cutoff-multimode resonant frequency given in Equation (B.1) to account for the loading effect of the EUT.
Because the cell operates with the fundamental TEM mode, broadband CW testing with amplitude or frequency modulation is possible. In addition, the cell can be used to establish impulsive waveforms for testing by using an appropriate waveform generator connected to the cell input port, assuming the frequency content of the waveform does not exceed the multimode cutoff frequency of the cell.
B.10 Test equipment recommended for RI-6: electric field immunity, 80 MHz to 10 GHz (IEC 61000-4-3) Following is a list of required equipment. Table B.2 and Table B.3 provide guidance on power requirements to attain the desired fields. a)
Signal source 1)
Frequency range: 10 kHz to 10 GHz
2)
Output power: 0 mW to 10 mW 39 Copyright © 2010 IEEE. All rights reserved.
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ANSI C63.15-2010 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment
3)
Output impedance: 50 Ω
4)
Gain: greater than 40 dB
5)
Harmonic distortion: more than 25 dB below fundamental when operating at 80 % power rating
6)
Output gain/amplitude flatness: ± 1.5 dB
b)
EMI receiver (as specified in ANSI C63.2)
c)
RF power attenuator
d)
e)
1)
Frequency range: 80 MHz to 10 GHz
2)
Attenuation: as required to prevent the RF power going into the EMI receiver from exceeding 1 mW peak
3)
Impedance: 50 Ω
4)
Amplifier RF power rating: 20 W average
5)
VSWR: 1.2:1 maximum
Test enclosure 1)
Size: large enough to accept test sample and antennas that will be positioned no closer than 1 m to the shielded enclosure surface or absorber material.
2)
Shielding effectiveness: to ensure cost effectiveness, the shielding requirements of the enclosure should be determined on a case-by-case basis depending on the level of immunity electric field. (See IEEE Std 299.)
3)
Power-line filtering: Should provide at least 80 dB of insertion loss over the frequency range.
4)
RF-absorber material: Sufficient material should be applied to surfaces of chamber to meet uniform field deviation criteria of –0 dB to +6 dB.
Directional coupler 1)
Frequency range: 80 MHz to 10 GHz
2) Nominal coupling: 10 dB 3)
Maximum coupling variation: 0.5 dB
4)
Impedance: 50 Ω
Table B.2—Guidance for obtaining the desired field as function of the amplifier power (in W) for a biconical dipole antenna as radiator, 1 m separation from EUT Field strength V/m
Frequency MHz
1
80 100 160 200 240 280 300
0.09 0.09 0.09 0.07 0.08 0.09 0.09
5
10
20
9.3 9.2 8.6 7.3 8.0 8.6 8.8
37.2 36.7 34.4 29.4 32.0 34.6 35.3
Amplifier power W
2.3 2.3 2.1 1.8 2.0 2.2 2.2
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